Built-in test for circuits with scan based on reseeding of multiole polynomial linear feedback shift registers
| Author details: | Sybille Hellebrand, Janusz Rajski, Steffen Tarnick, Srikanth Venkatraman, Bernard Courtois |
|---|---|
| Publication type: | Article |
| Language: | English |
| Year of first publication: | 1995 |
| Publication year: | 1995 |
| Release date: | 2017/03/25 |
| Source: | IEEE transactions on computers. - 44 (1995), 2, S. 223 - 233 |
| Organizational units: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik und Computational Science |
| Institution name at the time of the publication: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik |
