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A multi-mode scannable memory element for high test application efficiency and delay testing

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Author:Egor S. Sogomonyan, Adit D. Singh, Michael Gössel
Document Type:Article
Year of first Publication:1998
Year of Completion:1998
Release Date:2017/03/24
Source:Proceedings / 16th IEEE VLSI Test Symposium. - Los Alamitos : IEEE Computer Society Press, 1998. - S. 324 - 331
Organizational units:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik und Computational Science
Publication Way:Open Access
Institution name at the time of publication:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik