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Self-dual parity checking - a new method for on-line testing

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Author details:Vl. V. Saposhnikov, Alexej Dimitriev, Michael GösselGND, Va. V. Saposhnikov
Publication type:Article
Language:English
Year of first publication:1996
Publication year:1996
Release date:2017/03/25
Source:Proceedings / 14th IEEE VLSI Test Symposium. - Los Alamitos : IEEE Computer Society Press, 1996. - S. 162 - 168
Organizational units:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik und Computational Science
Institution name at the time of the publication:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik
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