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Masking of X-Values by use of a hierarchically configurable register

  • In this paper we consider masking of unknowns (X-values) for VLSI circuits. We present a new hierarchical method of X-masking which is a major improvement of the method proposed in [4], called WIDE1. By the method proposed, the number of observable scan cells is optimized and data volume for X-masking can be significantly reduced in comparison to WIDEL This is demonstrated for three industrial designs. In cases where all X-values have to be masked the novel approach is especially efficient.

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Author details:Thomas Rabenalt, Michael Goessel, Andreas Leininger
DOI:https://doi.org/10.1007/s10836-010-5179-2
ISSN:0923-8174
Title of parent work (English):Journal of electronic testing : theory and applications
Publisher:Springer
Place of publishing:Dordrecht
Publication type:Article
Language:English
Year of first publication:2011
Publication year:2011
Release date:2017/03/26
Tag:Hierarchically configurable mask register; Masking of X-values
Volume:27
Issue:1
Number of pages:11
First page:31
Last Page:41
Funding institution:German Federal Ministry for Education and Research (BMBF) [01M3063A]
Organizational units:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik und Computational Science
Peer review:Referiert
Institution name at the time of the publication:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik
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