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Time-domain sampling of x-ray pulses using an ultrafast sample response

  • We employ the ultrafast response of a 15.4 nm thin SrRuO3 layer grown epitaxially on a SrTiO3 substrate to perform time-domain sampling of an x-ray pulse emitted from a synchrotron storage ring. Excitation of the sample with an ultrashort laser pulse triggers coherent expansion and compression waves in the thin layer, which turn the diffraction efficiency on and off at a fixed Bragg angle during 5 ps. This is significantly shorter than the duration of the synchrotron x-ray pulse of 100 ps. Cross-correlation measurements of the ultrafast sample response and the synchrotron x-ray pulse allow to reconstruct the x-ray pulse shape.

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Author:P. Gaal, Daniel Schick, Marc Herzog, A. Bojahr, Roman Shayduk, J. Goldshteyn, Hengameh A. Navirian, Wolfram Leitenberger, Ionela Vrejoiu, D. Khakhulin, M. Wulff, Matias BargheerORCiDGND
DOI:https://doi.org/10.1063/1.4769828
ISSN:0003-6951 (print)
Parent Title (English):Applied physics letters
Publisher:American Institute of Physics
Place of publication:Melville
Document Type:Article
Language:English
Year of first Publication:2012
Year of Completion:2012
Release Date:2017/03/26
Volume:101
Issue:24
Pagenumber:4
Funder:BMBF [05K10IP1]
Organizational units:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik und Astronomie
Peer Review:Referiert