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Ultrafast lattice response of photoexcited thin films studied by X-ray diffraction

  • Using ultrafast X-ray diffraction, we study the coherent picosecond lattice dynamics of photoexcited thin films in the two limiting cases, where the photoinduced stress profile decays on a length scale larger and smaller than the film thickness. We solve a unifying analytical model of the strain propagation for acoustic impedance-matched opaque films on a semi-infinite transparent substrate, showing that the lattice dynamics essentially depend on two parameters: One for the spatial profile and one for the amplitude of the strain. We illustrate the results by comparison with high-quality ultrafast X-ray diffraction data of SrRuO3 films on SrTiO3 substrates. (C) 2014 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution 3.0 Unported License.

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Metadaten
Author details:Daniel Schick, Marc HerzogORCiDGND, Andre BojahrGND, Wolfram LeitenbergerGND, Andreas Hertwig, Roman Shayduk, Matias BargheerORCiDGND
DOI:https://doi.org/10.1063/1.4901228
ISSN:2329-7778
Title of parent work (English):Structural dynamics
Publisher:American Institute of Physics
Place of publishing:Melville
Publication type:Article
Language:English
Year of first publication:2014
Publication year:2014
Release date:2017/03/27
Volume:1
Issue:6
Number of pages:13
Funding institution:BMBF [05K10IP1]; DFG [BA2281/3-1]; Leibnitz graduate school "Dynamics in new Light"
Organizational units:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik und Astronomie
Peer review:Referiert
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