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A scan based concrrent BIST approach for low cost on-line testing

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Metadaten
Author:Egor S. Sogomonyan, Adit D. Singh, Michael Gössel
Document Type:Article
Language:English
Year of first Publication:1998
Year of Completion:1998
Release Date:2017/03/24
Source:4th IEEE international on-line testing workshop : proceedings. - IEEE Press, 1998. - S. 52 - 55
Organizational units:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik und Computational Science
Institution name at the time of publication:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik