Scanning system for high-energy electron diffractometry
| Author details: | Anatoly S. Avilov, Alexander K. Kulygin, Ullrich Pietsch, John C. H. Spence, Vladimir G. Tsirelson, Ming J. Zuo |
|---|---|
| URL: | http://www3.interscience.wiley.com/journal/118518709/home?CRETRY=1&SRETRY=0 |
| DOI: | https://doi.org/10.1107/S0021889899006755 |
| ISSN: | 0021-8898 |
| Publication type: | Article |
| Language: | English |
| Year of first publication: | 1999 |
| Publication year: | 1999 |
| Release date: | 2017/03/25 |
| Source: | Journal of applied crystallography. - ISSN 0021-8898. - 32 (1999), 6, S. 1033 - 1038 |
| Organizational units: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik und Astronomie |
| Peer review: | Referiert |
| Institution name at the time of the publication: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik |
