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3D high-resolution mapping of polarization profiles in thin poly(vinylidenefluoride-trifluoroethylene) (PVDF- TrFE) films using two thermal techniques

  • In this paper, two non-destructive thermal methods are used in order to determine, with a high degree of accuracy, three-dimensional polarization distributions in thin films (12 mu m) of poly(vinylidenefluoride- trifluoroethylene) (PVDF-TrFE). The techniques are the frequency-domain Focused Laser Intensity Modulation Method (FLIMM) and time-domain Thermal-Pulse Tomography (TPT). Samples were first metalized with grid-shaped electrode and poled. 3D polarization mapping yielded profiles which reproduce the electrode-grid shape. The polarization is not uniform across the sample thickness. Significant polarization values are found only at depths beyond 0.5 mu m from the sample surface. Both methods provide similar results, TPT method being faster, whereas the FLIMM technique has a better lateral resolution.

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Author details:Cong Duc Pham, Anca Petre, Laurent Berquez, Rosaura Flores SuárezGND, Axel MellingerORCiDGND, Werner WirgesORCiD, Reimund GerhardORCiDGND
URL:http://ieeexplore.ieee.org/servlet/opac?punumber=94
DOI:https://doi.org/10.1109/TDEI.2009.5128505
ISSN:1070-9878
Publication type:Article
Language:English
Year of first publication:2009
Publication year:2009
Release date:2017/03/25
Source:IEEE Transactions on dielectrics and electrical insulation. - ISSN 1070-9878. - 16 (2009), 3, S. 676 - 681
Organizational units:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik und Astronomie
Peer review:Referiert
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