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Principles and operation of a new type of electron spectrometer - ArTOF

  • A new energy and angular electron analyzer ArTOF (Angular Resolved Time of Flight) is described. The analyzer is based on simultaneous measurement of flight times and angles in an advanced electron lens system. In angular modes the new analyzer combines an increase in transmission by almost three orders of magnitude with improved resolution, in comparison to standard state-of-the-art electron spectrometers. In this report we describe some design principles and we give a review of calibration and alignment procedures necessary for the use of the ArTOF on a synchrotron radiation facility. Our program scripts to handle the large datasets are also discussed. Furthermore we give a broad description of the new research fields that benefit from the use of the ArTOF and give a short summary of the first results of angle resolved photoemission measurement with ArTOF using the single-bunch X-ray pulses from the BESSY II storage ring facility. (C) 2013 Published by Elsevier B.V.

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Metadaten
Author details:Ruslan Ovsyannikov, P. Karlsson, M. Lundqvist, C. Lupulescu, W. Eberhardt, Alexander FöhlischORCiDGND, S. Svensson, N. Martensson
DOI:https://doi.org/10.1016/j.elspec.2013.08.005
ISSN:0368-2048
ISSN:1873-2526
Title of parent work (English):Journal of electron spectroscopy and related phenomena : the international journal on theoretical and experimental aspects of electron spectroscopy
Publisher:Elsevier
Place of publishing:Amsterdam
Publication type:Article
Language:English
Year of first publication:2013
Publication year:2013
Release date:2017/03/26
Tag:ARPES; Electron spectroscopy; Synchrotron; Time of flight
Volume:191
Issue:12
Number of pages:12
First page:92
Last Page:103
Funding institution:Swedish Research Council (VR); "Carl Tryggers Stiftelse for Vetenskaplig Forskning" (CTS); Swedish Energy Agency (STEM); European Research Council [321319]
Organizational units:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik und Astronomie
Peer review:Referiert
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