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X-ray reflectivity study of an amphiphilic hex-peri-hexabenzocoronene at a structured silicon wafer surface

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Author:Ullrich Pietsch, Stephan Kubowicz, Andreas F. Thünemann, Thomas Geue, M. D. Watson, N. Tchebotareva, K. Müllen
Document Type:Article
Language:English
Year of first Publication:2003
Year of Completion:2003
Release Date:2017/03/24
Source:Langmuir. - 19 (2003), 26, S. 10997 - 10999
Organizational units:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik und Astronomie
Peer Review:Referiert
Institution name at the time of publication:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik