X-ray reflectivity study of an amphiphilic hex-peri-hexabenzocoronene at a structured silicon wafer surface
| Author details: | Ullrich Pietsch, Stephan Kubowicz, Andreas F. ThünemannORCiD, Thomas Geue, M. D. Watson, N. Tchebotareva, K. Müllen |
|---|---|
| Publication type: | Article |
| Language: | English |
| Year of first publication: | 2003 |
| Publication year: | 2003 |
| Release date: | 2017/03/24 |
| Source: | Langmuir. - 19 (2003), 26, S. 10997 - 10999 |
| Organizational units: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik und Astronomie |
| Peer review: | Referiert |
| Institution name at the time of the publication: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik |
