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Ultrafast reciprocal-space mapping with a convergent beam

  • A diffractometer setup is presented, based on a laser-driven plasma X-ray source for reciprocal-space mapping with femtosecond temporal resolution. In order to map out the reciprocal space, an X-ray optic with a convergent beam is used with an X-ray area detector to detect symmetrically and asymmetrically diffracted X-ray photons simultaneously. The setup is particularly suited for measuring thin films or imperfect bulk samples with broad rocking curves. For quasi-perfect crystalline samples with insignificant in-plane Bragg peak broadening, the measured reciprocal-space maps can be corrected for the known resolution function of the diffractometer in order to achieve high-resolution rocking curves with improved data quality. In this case, the resolution of the diffractometer is not limited by the convergence of the incoming X-ray beam but is solely determined by its energy bandwidth.

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Author details:Daniel Schick, Roman Shayduk, Andre BojahrGND, Marc HerzogORCiDGND, Clemens von Korff Schmising, Peter Gaal, Matias BargheerORCiDGND
DOI:https://doi.org/10.1107/S0021889813020013
ISSN:0021-8898
Title of parent work (English):JOURNAL OF APPLIED CRYSTALLOGRAPHY
Publisher:WILEY-BLACKWELL
Place of publishing:HOBOKEN
Publication type:Article
Language:English
Year of first publication:2013
Publication year:2013
Release date:2017/03/26
Volume:46
Issue:10
Number of pages:6
First page:1372
Last Page:1377
Funding institution:BMBF [03WKP03A]; Leibniz Graduate School ’Dynamics in New Light’ (DinL)
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