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A versatile detector for total fluorescence and electron yield experiments

  • The combination of a non-coated silicon photodiode with electron repelling meshes makes a versatile detector for total fluorescence yield and electron yield techniques highly suitable for x-ray absorption spectroscopy. In particular, a copper mesh with a bias voltage allows to suppress or transmit the electron yield signal. The performance of this detection scheme has been characterized by near edge x-ray absorption fine structure studies of thermal oxidized silicon and sapphire. The results show that the new detector probes both electron yield and for a bias voltage exceeding the maximum photon energy the total fluorescence yield.

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Author:Nele Thielemann-KühnORCiDGND, P. Hoffmann, Alexander FöhlischORCiDGND
ISSN:0034-6748 (print)
Parent Title (English):Review of scientific instruments : a monthly journal devoted to scientific instruments, apparatus, and techniques
Publisher:American Institute of Physics
Place of publication:Melville
Document Type:Article
Year of first Publication:2012
Year of Completion:2012
Release Date:2017/03/26
Organizational units:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik und Astronomie
Peer Review:Referiert