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ToF-SIMS imaging of plasma membrane lipids with sub-micrometer resolution

  • Time-of-flight secondary ion mass spectrometry (ToF-SIMS) was used for label-free analyses of the molecular lateral distribution of two different epithelial cell membranes (PANC-1 and UROtsa). The goal of the research was to enhance the ion yield of specific membrane molecules for improving the membrane imaging capability of ToF-SIMS on the nanoscale lateral dimension. For this task, a special silicon wafer sandwich preparation technique was optimized using different wafer materials, spacers, and washing procedures. Under optimized preparation conditions, the yield could be significantly enhanced, allowing imaging of the inhomogeneous distribution of phosphocholine (common head group for phosphatidylcholine and sphingomyelin) of a PANC-1 cell membrane's outer lipid layer with a lateral resolution of less than 200nm. Copyright (c) 2014 John Wiley & Sons, Ltd.

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Metadaten
Author:F. Draude, A. Pelster, M. Koersgen, R. Kassenboehmer, Tanja Schwerdtle, J. Muething, H. F. Arlinghaus
DOI:https://doi.org/10.1002/sia.5576
ISSN:0142-2421 (print)
ISSN:1096-9918 (online)
Parent Title (English):Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis surfaces, interfaces and thin films
Publisher:Wiley-Blackwell
Place of publication:Hoboken
Document Type:Article
Language:English
Year of first Publication:2014
Year of Completion:2014
Release Date:2017/03/27
Tag:ToF-SIMS; high-resolution imaging; lipid analysis; membrane analysis; sample preparation; yield enhancement
Volume:46
Pagenumber:4
First Page:127
Last Page:130
Organizational units:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Ernährungswissenschaft
Peer Review:Referiert