Rene Könnecke, R. Follath, N. Pontius, J. Schlappa, F. Eggenstein, T. Zeschke, P. Bischoff, J. -S. Schmidt, T. Noll, C. Trabant, S. Schreck, Ph. Wernet, S. Eisebitt, F. Senf, Christian Schuessler-Langeheine, A. Erko, Alexander Föhlisch
- At BESSY II a confocal plane grating spectrometer for resonant inelastic X-ray scattering (RIXS) is currently under commissioning. The new endstation operates with a source size of 4 x 1 mu m(2) provided by its dedicated beamline. The RIXS-spectrometer covers an energy range from 50 eV to 1000 eV, providing a resolving power E/Delta E of 5000-15,000. The beamline allows full polarization control and gives a photon flux of up to 7 x 10(14) photons/s/0.1 A/0.1%bandwidth by offering a resolving power E/Delta E of 4000-12,000.
Metadaten| Author details: | Rene Könnecke, R. Follath, N. Pontius, J. Schlappa, F. Eggenstein, T. Zeschke, P. Bischoff, J. -S. Schmidt, T. Noll, C. Trabant, S. Schreck, Ph. Wernet, S. Eisebitt, F. Senf, Christian Schuessler-LangeheineORCiD, A. Erko, Alexander FöhlischORCiDGND |
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| DOI: | https://doi.org/10.1016/j.elspec.2012.11.003 |
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| ISSN: | 0368-2048 |
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| Title of parent work (English): | Journal of electron spectroscopy and related phenomena : the international journal on theoretical and experimental aspects of electron spectroscopy |
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| Publisher: | Elsevier |
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| Place of publishing: | Amsterdam |
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| Publication type: | Article |
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| Language: | English |
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| Year of first publication: | 2013 |
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| Publication year: | 2013 |
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| Release date: | 2017/03/26 |
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| Tag: | High transmission micro focus beamline; Plane grating emission spectrometer; Resonant inelastic X-ray scattering; Soft X-ray monochromator |
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| Volume: | 188 |
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| Number of pages: | 7 |
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| First page: | 133 |
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| Last Page: | 139 |
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| Organizational units: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik und Astronomie |
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| Peer review: | Referiert |
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