X-ray reflectivity analysis of thin complex Langmuir-Blodgett films
| Author details: | P. Poloucek, Ullrich Pietsch, Thomas Geue, Christian Symietz, Gerald BrezesinskiORCiDGND |
|---|---|
| Publication type: | Article |
| Language: | English |
| Year of first publication: | 2001 |
| Publication year: | 2001 |
| Release date: | 2017/03/24 |
| Source: | Journal of physics / D. - 34 (2001) 4, S. 450 - 458 |
| Organizational units: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik und Astronomie |
| Institution name at the time of the publication: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik |
