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Local chemical composition of nanophase-separated polymer brushes

  • Using scattering scanning nearfield infrared microscopy (s-SNIM), we have imaged the nanoscale phase separation of mixed polystyrene-poly(methyl methacrylate) (PS-PMMA) brushes and investigated changes in the top layer as a function of solvent exposure. We deduce that the top-layer of the mixed brushes is composed primarily of PMMA after exposure to acetone, while after exposure to toluene this changes to PS. Access to simultaneously measured topographic and chemical information allows direct correlation of the chemical morphology of the sample with topographic information. Our results demonstrate the potential of s-SNIM for chemical mapping based on distinct infrared absorption properties of polymers with a high spatial resolution of 80 nm x 80 nm.

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Author:Marlena Filimon, Ilona Kopf, Dietrich A. Schmidt, Erik Bruendermann, Jürgen Rühe, Svetlana SanterORCiDGND, Martina Havenith
DOI:https://doi.org/10.1039/c0cp02756a
ISSN:1463-9076 (print)
Parent Title (English):Physical chemistry, chemical physics : a journal of European Chemical Societies
Publisher:Royal Society of Chemistry
Place of publication:Cambridge
Document Type:Article
Language:English
Year of first Publication:2011
Year of Completion:2011
Release Date:2017/03/26
Volume:13
Issue:24
Pagenumber:7
First Page:11620
Last Page:11626
Funder:INTCHEM [MEST-CT-2005-020681]; EU [FP7-NMP-2008-SMALL-2]; [BMBF 05KS7PC2]
Organizational units:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik und Astronomie
Peer Review:Referiert