Concurrently self-testing embedded checkers for ultra-reliable fault-tolerant systems
Author details: | Egor S. Sogomonyan, Michael GösselGND |
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Publication type: | Article |
Language: | English |
Year of first publication: | 1996 |
Publication year: | 1996 |
Release date: | 2017/03/25 |
Source: | Proceedings / 14th IEEE VLSI Test Symposium. - Los Alamitos : IEEE Computer Society Press, 1996. - S. 138 - 144 |
Organizational units: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik und Computational Science |
Institution name at the time of the publication: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik |