Investigations of semiconductor surfaces and interfaces by X-ray grazing incidence diffraction
| Author details: | Ullrich Pietsch |
|---|---|
| ISSN: | 0011-3891 |
| Publication type: | Article |
| Language: | English |
| Year of first publication: | 2000 |
| Publication year: | 2000 |
| Release date: | 2017/03/24 |
| Source: | Current science : fortnightly journal of research. - ISSN 0011-3891. - 78 (2000), 12, S. 1484 - 1495 |
| Organizational units: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik und Astronomie |
| Institution name at the time of the publication: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik |
