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X-ray reflectivity from sinusoidal surface relief gratings

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Author details:Thomas Geue, Oliver Henneberg, Ullrich Pietsch
ISSN:0023-4753
Publication type:Article
Language:English
Year of first publication:2002
Publication year:2002
Release date:2017/03/24
Source:Crystal research and technology : journal of experimental and industrial crystallography. - ISSN 0023-4753. - 37 (2002), 7, S. 770 - 776
Organizational units:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik und Astronomie
Institution name at the time of the publication:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik
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