X-ray scattering from silicon surfaces
| Author details: | Ralph Stömmer, H. Göbel, W. Hub, Ullrich Pietsch |
|---|---|
| Publication type: | Article |
| Language: | English |
| Year of first publication: | 1998 |
| Publication year: | 1998 |
| Release date: | 2017/03/24 |
| Source: | Semiconductor international. - 1 (1998), S. 81 - 88 |
| Organizational units: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik und Astronomie |
| Institution name at the time of the publication: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik |
