A comparison fo x-ray methods for structure refinement of Langmuir-Blodgett multilayers
- The possibilities and limits of structure refinement of Langmuir-Blodgett films by means of symmetrical reflection of X- rays are described using the example of a stearic acid multilayer. Three different techniques for the determiantion of the electron density profile from reflectivity data are compared; a Fourier method, a Patterson method, and model calculations. The important role of the a priori information for finding the besft structure model is outlined.
| Author details: | Jürgen Reiche, Ullrich Pietsch, Hans-Peter Fink, Helge Lemmetyinen |
|---|---|
| Publication type: | Article |
| Language: | English |
| Year of first publication: | 1992 |
| Publication year: | 1992 |
| Release date: | 2017/03/25 |
| Source: | Acta Polymerica. - 43 (1992), S. 206 - 209 |
| Organizational units: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik und Astronomie |
| Institution name at the time of the publication: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik |
