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X-ray reflectivity analysis of thin complex Langmuir-Blodgett films

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Metadaten
Author:P. Poloucek, Ullrich Pietsch, Thomas Geue, Christian Symietz, Gerald BrezesinskiORCiD
Document Type:Article
Language:English
Year of first Publication:2001
Year of Completion:2001
Release Date:2017/03/24
Source:Journal of physics / D. - 34 (2001) 4, S. 450 - 458
Organizational units:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik und Astronomie
Institution name at the time of publication:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik