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Characterization of lateral semiconductor nano structures by means of x-ray grazing-incidence diffraction

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Author details:K. Paschke, Thomas Geue, Thomas Andreas Barberka, A. Bolm, Ullrich Pietsch, M. Rösch, Edwin Batke, F. Faller, K. Kerkel, J. Oshiniwo, Alfred Forchel
Publication type:Article
Language:English
Year of first publication:1997
Publication year:1997
Release date:2017/03/24
Source:Applied physics letters. - 70 (1997), S. 1031
Organizational units:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik und Astronomie
Institution name at the time of the publication:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik
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