TY  - JOUR
A1  - Abboud, Ali
A1  - Send, Sebastian
A1  - Pashniak, N.
A1  - Leitenberger, Wolfram
A1  - Ihle, Sebastian
A1  - Huth, M.
A1  - Hartmann, Robert
A1  - Strüder, Lothar
A1  - Pietsch, Ullrich
T1  - Sub-pixel resolution of a pnCCD for X-ray white beam applications
JF  - Journal of instrumentation
N2  - A new approach to achieve sub-pixel spatial resolution in a pnCCD detector with 75 x 75 mu m(2) pixel size is proposed for X-ray applications in single photon counting mode. The approach considers the energy dependence of the charge cloud created by a single photon and its split probabilities between neighboring pixels of the detector based on a rectangular model for the charge cloud density. For cases where the charge of this cloud becomes distributed over three or four pixels the center position of photon impact can be reconstructed with a precision better than 2 mu m. The predicted charge cloud sizes are tested at selected X-ray fluorescence lines emitting energies between 6.4 keV and 17.4 keV and forming charge clouds with size (rms) varying between 8 mu m and 10 mu m respectively. The 2 mu m enhanced spatial resolution of the pnCCD is verified by means of an x-ray transmission experiment throughout an optical grating.
KW  - Solid state detectors
KW  - Interaction of radiation with matter
KW  - Detector modelling and simulations II (electric fields, charge transport, multiplication and induction, pulse formation, electron emission, etc)
Y1  - 2013
U6  - https://doi.org/10.1088/1748-0221/8/05/P05005
SN  - 1748-0221
VL  - 8
IS  - 3
PB  - IOP Publ. Ltd.
CY  - Bristol
ER  - 
TY  - JOUR
A1  - Avilov, Anatoly S.
A1  - Kulygin, Alexander K.
A1  - Pietsch, Ullrich
A1  - Spence, John C. H.
A1  - Tsirelson, Vladimir G.
A1  - Zuo, Ming J.
T1  - Scanning system for high-energy electron diffractometry
Y1  - 1999
UR  - http://www3.interscience.wiley.com/journal/118518709/home?CRETRY=1&SRETRY=0
U6  - https://doi.org/10.1107/S0021889899006755
SN  - 0021-8898
ER  - 
TY  - JOUR
A1  - Avilov, Anatoly S.
A1  - Lepeshov, G. G.
A1  - Pietsch, Ullrich
A1  - Tsirelson, Vladimir G.
T1  - Multipole analysis of the electron density and electrostatic potential in Germanium by high-resolution electron diffraction
Y1  - 2001
SN  - 0022-3697
ER  - 
TY  - JOUR
A1  - Bodenthin, Yves
A1  - Grenzer, Jörg
A1  - Lauter, Robert
A1  - Pietsch, Ullrich
A1  - Lehmann, Pit
A1  - Kurth, Dirk G.
A1  - Möhwald, Helmuth
T1  - Temperature and time resolved x-ray scattering at thin organic films
Y1  - 2002
ER  - 
TY  - JOUR
A1  - Bolm, A.
A1  - Englisch, Uwe
A1  - Penacorada, Florencio
A1  - Gerstenberger, M.
A1  - Pietsch, Ullrich
T1  - Temperature and time dependent investigations of cd- and uranyl-stearate multilayers by means of neutron reflectivity measurements
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Brajpuriya, Ranjeet
A1  - Tripathi, Sumit
A1  - Sharma, Abhishek
A1  - Chaudhari, S.M.
A1  - Phase, D.M.
A1  - Gupta, Ajay
A1  - Shripathi, Thoudinja
A1  - Leitenberger, Wolfram
A1  - Pietsch, Ullrich
A1  - Laxmi, N.
T1  - Temperature dependent energy-dispersive X-ray diffraction and magnetic study of Fe/Al interface
N2  - In situ temperature dependent energy-dispersive structural and magnetic study of electron beam evaporated Fe/Al multilayer sample (MLS) has been investigated. The structural studies show the formation of an intermixed FeAl transition layer of a few nanometers thick at the interface during deposition, which on annealing at 300 degrees C transforms to B2FeAl intermetallic phase. Magnetization decreases with increase in temperature and drops to minimum above 300 degrees C due to increase in anti-ferromagnetic interlayer coupling and formation of nonmagnetic FeAl phase at the interface. The Curie temperature (T-c) is found to be 288 degrees C and is much less than that of bulk bcc Fe.
Y1  - 2007
UR  - http://www.sciencedirect.com/science/journal/01694332
U6  - https://doi.org/10.1016/j.apsusc.2007.04.069
SN  - 0169-4332
ER  - 
TY  - JOUR
A1  - Darowski, Nora
A1  - Lübbert, Daniel
A1  - Pietsch, Ullrich
A1  - Zhuang, Y.
A1  - Zerlauth, S.
A1  - Bauer, Günther
T1  - In-plane strain and strain relaxation in laterally patterned Si/SiGe quantum dots and wire arrays
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Darowski, Nora
A1  - Paschke, K.
A1  - Pietsch, Ullrich
A1  - Wang, K. H.
A1  - Forchel, Alfred
A1  - Baumbach, Tilo
A1  - Zeimer, Ute
T1  - Identification of a buried single quantum well within surface structurized semiconductors using depth resolved x-ray grazing-incidence diffraction
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Darowski, Nora
A1  - Paschke, K.
A1  - Pietsch, Ullrich
A1  - Wang, K. H.
A1  - Forchel, Alfred
A1  - Lübbert, Daniel
A1  - Baumbach, Tilo
T1  - Structural characterization of a GaAs surface wire structure by triple-axis X-ray grazing incidence diffraction
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Darowski, Nora
A1  - Pietsch, Ullrich
A1  - Wang, K. H.
A1  - Forchel, Alfred
A1  - Shen, W.
A1  - Kycia, S.
T1  - X-ray diffraction analysis of strain relaxation in free standing and buried GaAs/GaInAs/GaAs SQW lateral structures
Y1  - 1998
ER  -