TY  - JOUR
A1  - Darowski, Nora
A1  - Paschke, K.
A1  - Pietsch, Ullrich
A1  - Wang, K. H.
A1  - Forchel, Alfred
A1  - Baumbach, Tilo
A1  - Zeimer, Ute
T1  - Identification of a buried single quantum well within surface structurized semiconductors using depth resolved x-ray grazing-incidence diffraction
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Darowski, Nora
A1  - Pietsch, Ullrich
A1  - Wang, K. H.
A1  - Forchel, Alfred
A1  - Shen, W.
A1  - Kycia, S.
T1  - X-ray diffraction analysis of strain relaxation in free standing and buried GaAs/GaInAs/GaAs SQW lateral structures
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Darowski, Nora
A1  - Paschke, K.
A1  - Pietsch, Ullrich
A1  - Wang, K. H.
A1  - Forchel, Alfred
A1  - Lübbert, Daniel
A1  - Baumbach, Tilo
T1  - Structural characterization of a GaAs surface wire structure by triple-axis X-ray grazing incidence diffraction
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Darowski, Nora
A1  - Ulyanenkov, A.
A1  - Grenzer, Jörg
A1  - Wang, K. H.
A1  - Forchel, Alfred
T1  - Analysis of the strain distribution in lateral nanostructures for interpreting photoluminescence data
Y1  - 2000
ER  - 
TY  - JOUR
A1  - Ulyanenkov, A.
A1  - Baumbach, Tilo
A1  - Darowski, Nora
A1  - Pietsch, Ullrich
A1  - Wang, K. H.
A1  - Forchel, Alfred
A1  - Wiebach, T.
T1  - Investigation of the in-plane strain distribution in free-standing GaAs/InGaAs/GaAs single quantum well surface nanostructures on GaAs[001]
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Ulyanenkov, A.
A1  - Darowski, Nora
A1  - Grenzer, Jörg
A1  - Pietsch, Ullrich
A1  - Wang, K. H.
A1  - Forchel, Alfred
T1  - Evaluation of strain distribution in freestanding and bruied lateral nanostructures
Y1  - 1999
ER  -