TY  - JOUR
A1  - Sogomonyan, Egor S.
A1  - Singh, Adit D.
A1  - Gössel, Michael
T1  - A multi-mode scannable memory element for high test application efficiency and delay testing
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Saposhnikov, V. V.
A1  - Morosov, Andrej
A1  - Saposhnikov, Vl. V.
A1  - Gössel, Michael
T1  - A new design method for self-checking unidirectional combinational circuits
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Sogomonyan, Egor S.
A1  - Singh, Adit D.
A1  - Gössel, Michael
T1  - A scan based concrrent BIST approach for low cost on-line testing
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Seuring, Markus
A1  - Gössel, Michael
A1  - Sogomonyan, Egor S.
T1  - A structural approach for space compaction for concurrent checking and BIST
Y1  - 1998
ER  - 
TY  - BOOK
A1  - Seuring, Markus
A1  - Gössel, Michael
T1  - A structural approach for space compaction for sequential circuits
T3  - Preprint / Universität Potsdam, Institut für Informatik
Y1  - 1998
SN  - 0946-7580
VL  - 1998, 05
PB  - Univ.
CY  - Potsdam
ER  - 
TY  - JOUR
A1  - Bogue, Ted
A1  - Gössel, Michael
A1  - Jürgensen, Helmut
A1  - Zorian, Yervant
T1  - Built-in self-Test with an alternating output
Y1  - 1998
SN  - 0-8186-8359-7
ER  - 
TY  - JOUR
A1  - Saposhnikov, Vl. V.
A1  - Otscheretnij, Vitalij
A1  - Saposhnikov, V. V.
A1  - Gössel, Michael
T1  - Design of Fault-Tolerant Circuits by self-dual Duplication
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Seuring, Markus
A1  - Gössel, Michael
A1  - Sogomonyan, Egor S.
T1  - Ein strukturelles Verfahren zur Kompaktierung von Schaltungsausgaben für online-Fehlererkennungen und Selbstests
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Otscheretnij, Vitalij
A1  - Gössel, Michael
A1  - Saposhnikov, Vl. V.
A1  - Saposhnikov, V. V.
T1  - Fault-tolerant self-dual circuits with error detection by parity- and group parity prediction
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Gössel, Michael
A1  - Sogomonyan, Egor S.
T1  - On-line Test auf der Grundlage eines die Parität erhaltenden Signaturanalysators
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Morosov, Andrej
A1  - Saposhnikov, V. V.
A1  - Gössel, Michael
T1  - Self-Checking circuits with unidiectionally independent outputs
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Saposhnikov, Vl. V.
A1  - Saposhnikov, V. V.
A1  - Dimitriev, Alexej
A1  - Gössel, Michael
T1  - Self-dual duplication for error detection
Y1  - 1998
ER  -