TY  - JOUR
A1  - Gerber, Stefan
A1  - Gössel, Michael
T1  - Detection of permanent faults of a floating point adder by pseudoduplication
Y1  - 1994
ER  - 
TY  - BOOK
A1  - Saposhnikov, V. V.
A1  - Saposhnikov, Vl. V.
A1  - Morozov, Alexei
A1  - Gössel, Michael
T1  - Necessary and Sufficient Conditions for the Existence of Self-Checking Circuits ba Use of Complementary Circuits
T3  - Preprint / Universität Potsdam, Institut für Informatik
Y1  - 2004
SN  - 0946-7580
VL  - 2004, 1
PB  - Univ.
CY  - Potsdam
ER  - 
TY  - BOOK
A1  - Marienfeld, Daniel
A1  - Sogomonyan, Egor S.
A1  - Ocheretnij, V.
A1  - Gössel, Michael
T1  - Self-checking Output-duplicated Booth-2 Multiplier
T3  - Preprint / Universität Potsdam, Institut für Informatik
Y1  - 2005
SN  - 0946-7580
VL  - 2005, 1
PB  - Univ.
CY  - Potsdam
ER  - 
TY  - BOOK
A1  - Sogomonyan, Egor S.
A1  - Marienfeld, Daniel
A1  - Gössel, Michael
T1  - Fehlerkorrektur und Fehlererkennung
T3  - Preprint / Universität Potsdam, Institut für Informatik
Y1  - 2006
SN  - 0946-7580
VL  - 2006, 3
PB  - Univ.
CY  - Potsdam
ER  - 
TY  - BOOK
A1  - Börner, Ferdinand
A1  - Gössel, Michael
T1  - Grundlagen digitaler Systeme
Y1  - 2005
SN  - 978-3-937786-46-9
PB  - Univ.-Verl.
CY  - Potsdam
ER  - 
TY  - JOUR
A1  - Ocheretnij, Vitalij
A1  - Gössel, Michael
A1  - Sogomonyan, Egor S.
A1  - Marienfeld, Daniel
T1  - Modulo p=3 checking for a carry select adder
N2  - In this paper a self-checking carry select adder is proposed. The duplicated adder blocks which are inherent to a carry select adder without error detection are checked modulo 3. Compared to a carry select adder without error detection the delay of the MSB of the sum of the proposed adder does not increase. Compared to a self-checking duplicated carry select adder the area is reduced by 20%. No restrictions are imposed on the design of the adder blocks
Y1  - 2006
UR  - http://www.springerlink.com/content/100286
U6  - https://doi.org/10.1007/s10836-006-6260-8
ER  - 
TY  - JOUR
A1  - Singh, Adit D.
A1  - Sogomonyan, Egor S.
A1  - Gössel, Michael
A1  - Seuring, Markus
T1  - Testability evaluation of sequential designs incorporating the multi-mode scannable memory element
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Dimitriev, Alexej
A1  - Saposhnikov, V. V.
A1  - Saposhnikov, Vl. V.
A1  - Gössel, Michael
T1  - Concurrent checking of sequential circuits by alternating inputs
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Otscheretnij, Vitalij
A1  - Saposhnikov, Vl. V.
A1  - Saposhnikov, V. V.
A1  - Gössel, Michael
T1  - Fault-tolerant self-dual circuits
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Saposhnikov, Vl. V. V. V.
A1  - Moshanin, Vl.
A1  - Saposhnikov, V. V.
A1  - Gössel, Michael
T1  - Experimental results for self-dual multi-output combinational circuits
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Saposhnikov, V. V.
A1  - Saposhnikov, Vl. V.
A1  - Gössel, Michael
A1  - Morosov, Andrej
T1  - A method of construction of combinational self-checking units with detection of all single faults
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Gössel, Michael
A1  - Dimitriev, Alexej
A1  - Saposhnikov, V. V.
A1  - Saposhnikov, Vl. V.
T1  - Eine selbsttestende Struktur zur on-line Fehlererkennung in kombinatorischen Schaltungen
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Saposhnikov, Vl. V.
A1  - Ocheretnij, V.
A1  - Saposhnikov, V. V.
A1  - Gössel, Michael
T1  - Modified TMR-system with reduced hardware overhead
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Gössel, Michael
A1  - Sogomonyan, Egor S.
T1  - New totally self-checking ripple and carry look-ahead adders
Y1  - 1999
ER  - 
TY  - BOOK
A1  - Börner, Ferdinand
A1  - Gössel, Michael
T1  - Grundlagen digitaler Systeme
Y1  - 2000
SN  - 3-9806494-9-0
PB  - Univ.-Bibliothek Publ.-Stelle
CY  - Potsdam
ER  - 
TY  - JOUR
A1  - Seuring, Markus
A1  - Gössel, Michael
A1  - Sogomonyan, Egor S.
T1  - Ein strukturelles Verfahren zur Kompaktierung von Schaltungsausgaben für online-Fehlererkennungen und Selbstests
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Saposhnikov, V. V.
A1  - Morosov, Andrej
A1  - Saposhnikov, Vl. V.
A1  - Gössel, Michael
T1  - A new design method for self-checking unidirectional combinational circuits
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Gössel, Michael
A1  - Sogomonyan, Egor S.
A1  - Morosov, Andrej
T1  - A new totally error propagating compactor for arbitrary cores with digital interfaces
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Seuring, Markus
A1  - Gössel, Michael
T1  - A structural approach for space compaction for sequential circuits
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Morosov, Andrej
A1  - Gössel, Michael
A1  - Hartje, Hendrik
T1  - Reduced area overhead of the input party for code-disjoint circuits
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Seuring, Markus
A1  - Gössel, Michael
T1  - A structural method for output compaction of sequential automata implemented as circuits
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Gössel, Michael
A1  - Sogomonyan, Egor S.
T1  - On-line Test auf der Grundlage eines die Parität erhaltenden Signaturanalysators
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Morosov, Andrej
A1  - Saposhnikov, V. V.
A1  - Gössel, Michael
T1  - Self-Checking circuits with unidiectionally independent outputs
Y1  - 1998
ER  - 
TY  - BOOK
A1  - Seuring, Markus
A1  - Gössel, Michael
T1  - A structural approach for space compaction for sequential circuits
T3  - Preprint / Universität Potsdam, Institut für Informatik
Y1  - 1998
SN  - 0946-7580
VL  - 1998, 05
PB  - Univ.
CY  - Potsdam
ER  - 
TY  - JOUR
A1  - Hlawiczka, A.
A1  - Gössel, Michael
A1  - Sogomonyan, Egor S.
T1  - A linear code-preserving signature analyzer COPMISR
Y1  - 1997
SN  - 0-8186-7810-0
ER  - 
TY  - JOUR
A1  - Saposhnikov, Vl. V.
A1  - Otscheretnij, Vitalij
A1  - Saposhnikov, V. V.
A1  - Gössel, Michael
T1  - Design of Fault-Tolerant Circuits by self-dual Duplication
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Bogue, Ted
A1  - Gössel, Michael
A1  - Jürgensen, Helmut
A1  - Zorian, Yervant
T1  - Built-in self-Test with an alternating output
Y1  - 1998
SN  - 0-8186-8359-7
ER  - 
TY  - JOUR
A1  - Otscheretnij, Vitalij
A1  - Gössel, Michael
A1  - Saposhnikov, Vl. V.
A1  - Saposhnikov, V. V.
T1  - Fault-tolerant self-dual circuits with error detection by parity- and group parity prediction
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Sogomonyan, Egor S.
A1  - Singh, Adit D.
A1  - Gössel, Michael
T1  - A multi-mode scannable memory element for high test application efficiency and delay testing
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Seuring, Markus
A1  - Gössel, Michael
A1  - Sogomonyan, Egor S.
T1  - A structural approach for space compaction for concurrent checking and BIST
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Saposhnikov, Vl. V.
A1  - Saposhnikov, V. V.
A1  - Dimitriev, Alexej
A1  - Gössel, Michael
T1  - Self-dual duplication for error detection
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Sogomonyan, Egor S.
A1  - Singh, Adit D.
A1  - Gössel, Michael
T1  - A scan based concrrent BIST approach for low cost on-line testing
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Hartje, Hendrik
A1  - Gössel, Michael
A1  - Sogomonyan, Egor S.
T1  - Synthesis of code-disjoint combinational circuits
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Saposhnikov, Va. V.
A1  - Morosov, Andrej
A1  - Saposhnikov, Vl. V.
A1  - Gössel, Michael
T1  - Design of self-checking unidirectional combinational circuits with low area overhead
Y1  - 1996
ER  - 
TY  - JOUR
A1  - Morosov, Andrej
A1  - Saposhnikov, V. V.
A1  - Saposhnikov, Vl. V.
A1  - Gössel, Michael
T1  - Ein Transformationsalgorithmus einer kombinatorischen Schaltung in eine monotone Schaltung
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Dimitriev, Alexej
A1  - Saposhnikov, Vl. V.
A1  - Gössel, Michael
A1  - Saposhnikov, V. V.
T1  - On-line testing by self-dual duplication
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Dimitriev, Alexej
A1  - Saposhnikov, Vl. V.
A1  - Gössel, Michael
A1  - Saposhnikov, V. V.
T1  - Self-dual duplication - a new method for on-line testing
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Saposhnikov, Vl. V.
A1  - Moshanin, Vl.
A1  - Saposhnikov, V. V.
A1  - Gössel, Michael
T1  - Self-dual multi output combinational circuits with output data compaction
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Morosov, Andrej
A1  - Saposhnikov, Vl. V.
A1  - Saposhnikov, V. V.
A1  - Gössel, Michael
T1  - Design of self dual fault-secure combinational circuits
Y1  - 1997
ER  - 
TY  - BOOK
A1  - Seuring, Markus
A1  - Gössel, Michael
A1  - Sogomonyan, Egor S.
T1  - A structural approach for space compaction for concurrent checking and BIST
T3  - Preprint / Universität Potsdam, Institut für Informatik
Y1  - 1997
SN  - 0946-7580
VL  - 1997, 01
PB  - Univ. Potsdam
CY  - Potsdam [u.a.]
ER  - 
TY  - JOUR
A1  - Hartje, Hendrik
A1  - Sogomonyan, Egor S.
A1  - Gössel, Michael
T1  - Code disjoint circuits for partity codes
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Moschanin, Wladimir
A1  - Saposhnikov, Vl. V.
A1  - Saposhnikov, Va. V.
A1  - Gössel, Michael
T1  - Synthesis of self-dual multi-output combinational circuits for on-line Teting
Y1  - 1996
ER  - 
TY  - JOUR
A1  - Saposhnikov, Vl. V.
A1  - Dimitriev, Alexej
A1  - Gössel, Michael
A1  - Saposhnikov, Va. V.
T1  - Self-dual parity checking - a new method for on-line testing
Y1  - 1996
ER  - 
TY  - JOUR
A1  - Gössel, Michael
A1  - Sogomonyan, Egor S.
T1  - A new self-testing parity checker for ultra-reliable applications
Y1  - 1996
ER  - 
TY  - JOUR
A1  - Sogomonyan, Egor S.
A1  - Gössel, Michael
T1  - Concurrently self-testing embedded checkers for ultra-reliable fault-tolerant systems
Y1  - 1996
ER  - 
TY  - JOUR
A1  - Gössel, Michael
A1  - Sogomonyan, Egor S.
T1  - A parity-preserving multi-input signature analyzer and it application for concurrent checking and BIST
Y1  - 1996
ER  - 
TY  - JOUR
A1  - Gössel, Michael
A1  - Sogomonyan, Egor S.
T1  - Self-parity combinational-circuits for self-testing, concurrent fault-detection and parity scan design
Y1  - 1994
ER  - 
TY  - JOUR
A1  - Sogomonyan, Egor S.
A1  - Gössel, Michael
T1  - A new parity preserving multi-input signature analyser
Y1  - 1995
ER  - 
TY  - JOUR
A1  - Kundu, S.
A1  - Sogomonyan, Egor S.
A1  - Gössel, Michael
A1  - Tarnick, Steffen
T1  - Self-checking comparator with one periodiv output
Y1  - 1996
ER  - 
TY  - JOUR
A1  - Bogue, Ted
A1  - Jürgensen, Helmut
A1  - Gössel, Michael
T1  - BIST with negligible aliasing through random cover circuits
Y1  - 1995
ER  -