TY  - JOUR
A1  - Hellebrand, Sybille
A1  - Rajski, Janusz
A1  - Tarnick, Steffen
A1  - Venkatraman, Srikanth
A1  - Courtois, Bernard
T1  - Built-in test for circuits with scan based on reseeding of multiole polynomial linear feedback shift registers
Y1  - 1995
ER  -