TY  - JOUR
A1  - Gerber, Stefan
A1  - Gössel, Michael
T1  - Detection of permanent faults of a floating point adder by pseudoduplication
Y1  - 1994
ER  - 
TY  - BOOK
A1  - Saposhnikov, V. V.
A1  - Saposhnikov, Vl. V.
A1  - Morozov, Alexei
A1  - Gössel, Michael
T1  - Necessary and Sufficient Conditions for the Existence of Self-Checking Circuits ba Use of Complementary Circuits
T3  - Preprint / Universität Potsdam, Institut für Informatik
Y1  - 2004
SN  - 0946-7580
VL  - 2004, 1
PB  - Univ.
CY  - Potsdam
ER  - 
TY  - BOOK
A1  - Marienfeld, Daniel
A1  - Sogomonyan, Egor S.
A1  - Ocheretnij, V.
A1  - Gössel, Michael
T1  - Self-checking Output-duplicated Booth-2 Multiplier
T3  - Preprint / Universität Potsdam, Institut für Informatik
Y1  - 2005
SN  - 0946-7580
VL  - 2005, 1
PB  - Univ.
CY  - Potsdam
ER  - 
TY  - BOOK
A1  - Sogomonyan, Egor S.
A1  - Marienfeld, Daniel
A1  - Gössel, Michael
T1  - Fehlerkorrektur und Fehlererkennung
T3  - Preprint / Universität Potsdam, Institut für Informatik
Y1  - 2006
SN  - 0946-7580
VL  - 2006, 3
PB  - Univ.
CY  - Potsdam
ER  - 
TY  - BOOK
A1  - Börner, Ferdinand
A1  - Gössel, Michael
T1  - Grundlagen digitaler Systeme
Y1  - 2005
SN  - 978-3-937786-46-9
PB  - Univ.-Verl.
CY  - Potsdam
ER  - 
TY  - JOUR
A1  - Ocheretnij, Vitalij
A1  - Gössel, Michael
A1  - Sogomonyan, Egor S.
A1  - Marienfeld, Daniel
T1  - Modulo p=3 checking for a carry select adder
N2  - In this paper a self-checking carry select adder is proposed. The duplicated adder blocks which are inherent to a carry select adder without error detection are checked modulo 3. Compared to a carry select adder without error detection the delay of the MSB of the sum of the proposed adder does not increase. Compared to a self-checking duplicated carry select adder the area is reduced by 20%. No restrictions are imposed on the design of the adder blocks
Y1  - 2006
UR  - http://www.springerlink.com/content/100286
U6  - https://doi.org/10.1007/s10836-006-6260-8
ER  - 
TY  - JOUR
A1  - Singh, Adit D.
A1  - Sogomonyan, Egor S.
A1  - Gössel, Michael
A1  - Seuring, Markus
T1  - Testability evaluation of sequential designs incorporating the multi-mode scannable memory element
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Dimitriev, Alexej
A1  - Saposhnikov, V. V.
A1  - Saposhnikov, Vl. V.
A1  - Gössel, Michael
T1  - Concurrent checking of sequential circuits by alternating inputs
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Otscheretnij, Vitalij
A1  - Saposhnikov, Vl. V.
A1  - Saposhnikov, V. V.
A1  - Gössel, Michael
T1  - Fault-tolerant self-dual circuits
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Saposhnikov, Vl. V. V. V.
A1  - Moshanin, Vl.
A1  - Saposhnikov, V. V.
A1  - Gössel, Michael
T1  - Experimental results for self-dual multi-output combinational circuits
Y1  - 1999
ER  -