TY  - JOUR
A1  - Singh, Adit D.
A1  - Sogomonyan, Egor S.
A1  - Gössel, Michael
A1  - Seuring, Markus
T1  - Testability evaluation of sequential designs incorporating the multi-mode scannable memory element
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Sogomonyan, Egor S.
A1  - Singh, Adit D.
A1  - Gössel, Michael
T1  - A multi-mode scannable memory element for high test application efficiency and delay testing
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Sogomonyan, Egor S.
A1  - Singh, Adit D.
A1  - Gössel, Michael
T1  - A scan based concrrent BIST approach for low cost on-line testing
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Sogomonyan, Egor S.
A1  - Singh, Adit D.
A1  - Gössel, Michael
T1  - A multi-mode scannable memory element for high test application efficiency and delay testing
Y1  - 1999
ER  -