TY  - THES
A1  - Hilscher, Martin
T1  - Testdatenkompaktion durch beschleunigte Schieberegister mit vielen X-Werten
Y1  - 2010
CY  - Potsdam
ER  - 
TY  - JOUR
A1  - Hilscher, Martin
A1  - Braun, Michael
A1  - Richter, Michael
A1  - Leininger, Andreas
A1  - Gössel, Michael
T1  - X-tolerant test data compaction with accelerated shift registers
N2  - Using the timing flexibility of modern automatic test equipment (ATE) test response data can be compacted without the need for additional X-masking logic. In this article the test response is compacted by several multiple input shift registers without feedback (NF-MISR). The shift registers are running on a k-times higher clock frequency than the test clock. For each test clock cycle only one out of the k outputs of each shift register is evaluated by the ATE. The impact of consecutive X values within the scan chains is reduced by a periodic permutation of the NF-MISR inputs. As a result, no additional external control signals or test set dependent control logic is required. The benefits of the proposed method are shown by the example of an implementation on a Verigy ATE. Experiments on three industrial circuits demonstrate the effectiveness of the proposed approach in comparison to a commercial DFT solution.
Y1  - 2009
UR  - http://www.springerlink.com/content/100286
U6  - https://doi.org/10.1007/s10836-009-5107-5
SN  - 0923-8174
ER  -