TY  - JOUR
A1  - Saposhnikov, Va. V.
A1  - Morosov, Andrej
A1  - Saposhnikov, Vl. V.
A1  - Gössel, Michael
T1  - Design of self-checking unidirectional combinational circuits with low area overhead
Y1  - 1996
ER  - 
TY  - JOUR
A1  - Saposhnikov, Vl. V.
A1  - Dimitriev, Alexej
A1  - Gössel, Michael
A1  - Saposhnikov, Va. V.
T1  - Self-dual parity checking - a new method for on-line testing
Y1  - 1996
ER  - 
TY  - JOUR
A1  - Saposhnikov, Vl. V.
A1  - Moshanin, Vl.
A1  - Saposhnikov, V. V.
A1  - Gössel, Michael
T1  - Self-dual multi output combinational circuits with output data compaction
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Saposhnikov, Vl. V.
A1  - Ocheretnij, V.
A1  - Saposhnikov, V. V.
A1  - Gössel, Michael
T1  - Modified TMR-system with reduced hardware overhead
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Saposhnikov, Vl. V.
A1  - Otscheretnij, Vitalij
A1  - Saposhnikov, V. V.
A1  - Gössel, Michael
T1  - Design of Fault-Tolerant Circuits by self-dual Duplication
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Saposhnikov, Vl. V.
A1  - Saposhnikov, V. V.
A1  - Dimitriev, Alexej
A1  - Gössel, Michael
T1  - Self-dual duplication for error detection
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Saposhnikov, Vl. V. V. V.
A1  - Moshanin, Vl.
A1  - Saposhnikov, V. V.
A1  - Gössel, Michael
T1  - Experimental results for self-dual multi-output combinational circuits
Y1  - 1999
ER  - 
TY  - BOOK
A1  - Sapoznikov, V. V.
A1  - Sapoznikov, VL. V.
A1  - Gössel, Michael
T1  - Samodvojstvennye diskretnye ustrojstva
Y1  - 2001
SN  - 5-283-04748-2
PB  - ?nergoatomizdat
CY  - Sankt-Peterburg
ER  - 
TY  - JOUR
A1  - Seuring, Markus
A1  - Gössel, Michael
T1  - A structural approach for space compaction for sequential circuits
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Seuring, Markus
A1  - Gössel, Michael
T1  - A structural method for output compaction of sequential automata implemented as circuits
Y1  - 1999
ER  - 
TY  - BOOK
A1  - Seuring, Markus
A1  - Gössel, Michael
T1  - A structural approach for space compaction for sequential circuits
T3  - Preprint / Universität Potsdam, Institut für Informatik
Y1  - 1998
SN  - 0946-7580
VL  - 1998, 05
PB  - Univ.
CY  - Potsdam
ER  - 
TY  - JOUR
A1  - Seuring, Markus
A1  - Gössel, Michael
A1  - Sogomonyan, Egor S.
T1  - A structural approach for space compaction for concurrent checking and BIST
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Seuring, Markus
A1  - Gössel, Michael
A1  - Sogomonyan, Egor S.
T1  - Ein strukturelles Verfahren zur Kompaktierung von Schaltungsausgaben für online-Fehlererkennungen und Selbstests
Y1  - 1998
ER  - 
TY  - BOOK
A1  - Seuring, Markus
A1  - Gössel, Michael
A1  - Sogomonyan, Egor S.
T1  - A structural approach for space compaction for concurrent checking and BIST
T3  - Preprint / Universität Potsdam, Institut für Informatik
Y1  - 1997
SN  - 0946-7580
VL  - 1997, 01
PB  - Univ. Potsdam
CY  - Potsdam [u.a.]
ER  - 
TY  - JOUR
A1  - Singh, Adit D.
A1  - Sogomonyan, Egor S.
A1  - Gössel, Michael
A1  - Seuring, Markus
T1  - Testability evaluation of sequential designs incorporating the multi-mode scannable memory element
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Sogomonyan, Egor S.
A1  - Gössel, Michael
T1  - A new parity preserving multi-input signature analyser
Y1  - 1995
ER  - 
TY  - JOUR
A1  - Sogomonyan, Egor S.
A1  - Gössel, Michael
T1  - Concurrently self-testing embedded checkers for ultra-reliable fault-tolerant systems
Y1  - 1996
ER  - 
TY  - BOOK
A1  - Sogomonyan, Egor S.
A1  - Marienfeld, Daniel
A1  - Gössel, Michael
T1  - Fehlerkorrektur und Fehlererkennung
T3  - Preprint / Universität Potsdam, Institut für Informatik
Y1  - 2006
SN  - 0946-7580
VL  - 2006, 3
PB  - Univ.
CY  - Potsdam
ER  - 
TY  - BOOK
A1  - Sogomonyan, Egor S.
A1  - Marienfeld, Daniel
A1  - Ocheretnij, V.
A1  - Gössel, Michael
T1  - A new self-checking sum-bit duplicated carry-select adder
T3  - Preprint / Universität Potsdam, Institut für Informatik
Y1  - 2003
SN  - 0946-7580
VL  - 2003, 5
PB  - Univ.
CY  - Potsdam
ER  - 
TY  - JOUR
A1  - Sogomonyan, Egor S.
A1  - Singh, Adit D.
A1  - Gössel, Michael
T1  - A scan based concrrent BIST approach for low cost on-line testing
Y1  - 1998
ER  -