TY  - JOUR
A1  - Li, Yuanqing
A1  - Breitenreiter, Anselm
A1  - Andjelkovic, Marko
A1  - Chen, Junchao
A1  - Babic, Milan
A1  - Krstić, Miloš
T1  - Double cell upsets mitigation through triple modular redundancy
JF  - Microelectronics Journal
N2  - A triple modular redundancy (TMR) based design technique for double cell upsets (DCUs) mitigation is investigated in this paper. This technique adds three extra self-voter circuits into a traditional TMR structure to enable the enhanced error correction capability. Fault-injection simulations show that the soft error rate (SER) of the proposed technique is lower than 3% of that of TMR. The implementation of this proposed technique is compatible with the automatic digital design flow, and its applicability and performance are evaluated on an FIFO circuit.
KW  - Triple modular redundancy (TMR)
KW  - Double cell upsets (DCUs)
Y1  - 2019
U6  - https://doi.org/10.1016/j.mejo.2019.104683
SN  - 0026-2692
SN  - 1879-2391
VL  - 96
PB  - Elsevier
CY  - Oxford
ER  -