TY - THES A1 - Grum, Marcus T1 - Construction of a concept of neuronal modeling N2 - The business problem of having inefficient processes, imprecise process analyses, and simulations as well as non-transparent artificial neuronal network models can be overcome by an easy-to-use modeling concept. With the aim of developing a flexible and efficient approach to modeling, simulating, and optimizing processes, this paper proposes a flexible Concept of Neuronal Modeling (CoNM). The modeling concept, which is described by the modeling language designed and its mathematical formulation and is connected to a technical substantiation, is based on a collection of novel sub-artifacts. As these have been implemented as a computational model, the set of CoNM tools carries out novel kinds of Neuronal Process Modeling (NPM), Neuronal Process Simulations (NPS), and Neuronal Process Optimizations (NPO). The efficacy of the designed artifacts was demonstrated rigorously by means of six experiments and a simulator of real industrial production processes. N2 - Die vorliegende Arbeit addressiert das Geschäftsproblem von ineffizienten Prozessen, unpräzisen Prozessanalysen und -simulationen sowie untransparenten künstlichen neuronalen Netzwerken, indem ein Modellierungskonzept zum Neuronalen Modellieren konstruiert wird. Dieses neuartige Konzept des Neuronalen Modellierens (CoNM) fungiert als flexibler und effizienter Ansatz zum Modellieren, Simulieren und Optimieren von Prozessen mit Hilfe von neuronalen Netzwerken und wird mittels einer Modellierungssprache, dessen mathematischen Formalisierung und technischen Substanziierung sowie einer Sammlung von neuartigen Subartefakten beschrieben. In der Verwendung derer Implementierung als CoNM-Werkzeuge können somit neue Arten einer Neuronalen-Prozess-Modellierung (NPM), Neuronalen-Prozess-Simulation (NPS) sowie Neuronalen-Prozess-Optimierung (NPO) realisiert werden. Die Wirksamkeit der erstellten Artefakte wurde anhand von sechs Experimenten demonstriert sowie in einem Simulator in realen Produktionsprozessen gezeigt. T2 - Konzept des Neuronalen Modellierens KW - Deep Learning KW - Artificial Neuronal Network KW - Explainability KW - Interpretability KW - Business Process KW - Simulation KW - Optimization KW - Knowledge Management KW - Process Management KW - Modeling KW - Process KW - Knowledge KW - Learning KW - Enterprise Architecture KW - Industry 4.0 KW - Künstliche Neuronale Netzwerke KW - Erklärbarkeit KW - Interpretierbarkeit KW - Geschäftsprozess KW - Simulation KW - Optimierung KW - Wissensmanagement KW - Prozessmanagement KW - Modellierung KW - Prozess KW - Wissen KW - Lernen KW - Enterprise Architecture KW - Industrie 4.0 Y1 - 2021 ER - TY - JOUR A1 - Li, Yuanqing A1 - Chen, Li A1 - Nofal, Issam A1 - Chen, Mo A1 - Wang, Haibin A1 - Liu, Rui A1 - Chen, Qingyu A1 - Krstić, Miloš A1 - Shi, Shuting A1 - Guo, Gang A1 - Baeg, Sang H. A1 - Wen, Shi-Jie A1 - Wong, Richard T1 - Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree JF - Microelectronics reliability N2 - The soft error rate (SER) due to heavy-ion irradiation of a clock tree is investigated in this paper. A method for clock tree SER prediction is developed, which employs a dedicated soft error analysis tool to characterize the single-event transient (SET) sensitivities of clock inverters and other commercial tools to calculate the SER through fault-injection simulations. A test circuit including a flip-flop chain and clock tree in a 65 nm CMOS technology is developed through the automatic ASIC design flow. This circuit is analyzed with the developed method to calculate its clock tree SER. In addition, this circuit is implemented in a 65 nm test chip and irradiated by heavy ions to measure its SER resulting from the SETs in the clock tree. The experimental and calculation results of this case study present good correlation, which verifies the effectiveness of the developed method. KW - Clock tree KW - Modeling KW - Single-event transient (SET) Y1 - 2018 U6 - https://doi.org/10.1016/j.microrel.2018.05.016 SN - 0026-2714 VL - 87 SP - 24 EP - 32 PB - Elsevier CY - Oxford ER -