TY  - JOUR
A1  - Andjelkovic, Marko
A1  - Simevski, Aleksandar
A1  - Chen, Junchao
A1  - Schrape, Oliver
A1  - Stamenkovic, Zoran
A1  - Krstić, Miloš
A1  - Ilic, Stefan
A1  - Ristic, Goran
A1  - Jaksic, Aleksandar
A1  - Vasovic, Nikola
A1  - Duane, Russell
A1  - Palma, Alberto J.
A1  - Lallena, Antonio M.
A1  - Carvajal, Miguel A.
T1  - A design concept for radiation hardened RADFET readout system for space applications
JF  - Microprocessors and microsystems
N2  - Instruments for measuring the absorbed dose and dose rate under radiation exposure, known as radiation dosimeters, are indispensable in space missions. They are composed of radiation sensors that generate current or voltage response when exposed to ionizing radiation, and processing electronics for computing the absorbed dose and dose rate. Among a wide range of existing radiation sensors, the Radiation Sensitive Field Effect Transistors (RADFETs) have unique advantages for absorbed dose measurement, and a proven record of successful exploitation in space missions. It has been shown that the RADFETs may be also used for the dose rate monitoring. In that regard, we propose a unique design concept that supports the simultaneous operation of a single RADFET as absorbed dose and dose rate monitor. This enables to reduce the cost of implementation, since the need for other types of radiation sensors can be minimized or eliminated. For processing the RADFET's response we propose a readout system composed of analog signal conditioner (ASC) and a self-adaptive multiprocessing system-on-chip (MPSoC). The soft error rate of MPSoC is monitored in real time with embedded sensors, allowing the autonomous switching between three operating modes (high-performance, de-stress and fault-tolerant), according to the application requirements and radiation conditions.
KW  - RADFET
KW  - Radiation hardness
KW  - Absorbed dose
KW  - Dose rate
KW  - Self-adaptive MPSoC
Y1  - 2022
U6  - https://doi.org/10.1016/j.micpro.2022.104486
SN  - 0141-9331
SN  - 1872-9436
VL  - 90
PB  - Elsevier
CY  - Amsterdam
ER  -