TY  - JOUR
A1  - Zeuschner, S. P.
A1  - Mattern, M.
A1  - Pudell, Jan-Etienne
A1  - von Reppert, A.
A1  - Rössle, M.
A1  - Leitenberger, Wolfram
A1  - Schwarzkopf, J.
A1  - Boschker, J. E.
A1  - Herzog, Marc
A1  - Bargheer, Matias
T1  - Reciprocal space slicing
BT  - a time-efficient approach to femtosecond x-ray diffraction
JF  - Structural Dynamics
N2  - An experimental technique that allows faster assessment of out-of-plane strain dynamics of thin film heterostructures via x-ray diffraction is presented. In contrast to conventional high-speed reciprocal space-mapping setups, our approach reduces the measurement time drastically due to a fixed measurement geometry with a position-sensitive detector. This means that neither the incident (ω) nor the exit (2θ) diffraction angle is scanned during the strain assessment via x-ray diffraction. Shifts of diffraction peaks on the fixed x-ray area detector originate from an out-of-plane strain within the sample. Quantitative strain assessment requires the determination of a factor relating the observed shift to the change in the reciprocal lattice vector. The factor depends only on the widths of the peak along certain directions in reciprocal space, the diffraction angle of the studied reflection, and the resolution of the instrumental setup. We provide a full theoretical explanation and exemplify the concept with picosecond strain dynamics of a thin layer of NbO2.
Y1  - 0202
U6  - https://doi.org/10.1063/4.0000040
SN  - 2329-7778
VL  - 8
PB  - AIP Publishing LLC
CY  - Melville, NY
ER  - 
TY  - GEN
A1  - Zeuschner, S. P.
A1  - Mattern, M.
A1  - Pudell, Jan-Etienne
A1  - von Reppert, A.
A1  - Rössle, M.
A1  - Leitenberger, Wolfram
A1  - Schwarzkopf, J.
A1  - Boschker, J. E.
A1  - Herzog, Marc
A1  - Bargheer, Matias
T1  - Reciprocal space slicing
BT  - a time-efficient approach to femtosecond x-ray diffraction
T2  - Postprints der Universität Potsdam : Mathematisch-Naturwissenschaftliche Reihe
N2  - An experimental technique that allows faster assessment of out-of-plane strain dynamics of thin film heterostructures via x-ray diffraction is presented. In contrast to conventional high-speed reciprocal space-mapping setups, our approach reduces the measurement time drastically due to a fixed measurement geometry with a position-sensitive detector. This means that neither the incident (ω) nor the exit (2θ) diffraction angle is scanned during the strain assessment via x-ray diffraction. Shifts of diffraction peaks on the fixed x-ray area detector originate from an out-of-plane strain within the sample. Quantitative strain assessment requires the determination of a factor relating the observed shift to the change in the reciprocal lattice vector. The factor depends only on the widths of the peak along certain directions in reciprocal space, the diffraction angle of the studied reflection, and the resolution of the instrumental setup. We provide a full theoretical explanation and exemplify the concept with picosecond strain dynamics of a thin layer of NbO2.
T3  - Zweitveröffentlichungen der Universität Potsdam : Mathematisch-Naturwissenschaftliche Reihe - 1137 
Y1  - 2021
U6  - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:517-opus4-499761
SN  - 1866-8372
IS  - 1137
ER  -