TY - JOUR A1 - Kowarik, Stefan A1 - Gerlach, Andreas A1 - Leitenberger, Wolfram A1 - Hu J, Witte A1 - Wöll, Christoph A1 - Schreiber, Frank T1 - Energy-dispersive X-ray reflectivity and GID for real-time growth studies of pentacene thin films N2 - We use energy-dispersive X-ray reflectivity and grazing incidence diffraction (GID) to follow the growth of the crystalline organic semiconductor pentacene on silicon oxide in-situ and in real-time. The technique allows for monitoring Bragg reflections and measuring X-ray growth oscillations with a time resolution of 1 min in a wide q-range in reciprocal space extending over 0.25-0.80 angstrom(-1), i.e. sampling a large number of Fourier components simultaneously. A quantitative analysis of growth oscillations at several q-points yields the evolution of the surface roughness, showing a marked transition from layer-by-layer growth to strong roughening after four monolayers of pentacene have been deposited. (c) 2006 Elsevier B.V. All rights reserved. Y1 - 2007 UR - http://www.sciencedirect.com/science/journal/00406090 U6 - https://doi.org/10.1016/j.tsf.2006.12.020 SN - 0040-6090 ER - TY - JOUR A1 - Reddy, Raghavendra V. A1 - Puranik, Shikha A1 - Gupta, Ajay A1 - Leitenberger, Wolfram T1 - Study of FePt films prepared by reactive sputtering Y1 - 2007 UR - http://www.sciencedirect.com/science?_ob=MImg&_imagekey=B6TW4-4N49VG1-1- 9&_cdi=5552&_user=1584062&_orig=search&_coverDate=05%2F25%2F2007&_sk=999189990&view=c&wchp=dGLbVtb- zSkzS&md5=d04c9f9f7492f4ef5fb605bfbaf ER - TY - JOUR A1 - Pietsch, Ullrich A1 - Panzner, Tobias A1 - Leitenberger, Wolfram A1 - Vartanyants, Ivan A. T1 - Coherence experiments using white synchrotron radiation N2 - Experiments at the bending magnet beamline at BESSY II (EDR beamline) profit from the excellent coherence properties of third generation synchrotron sources. Considering the exponentially decaying incident spectrum, and because no optical elements are installed except slits and vacuum windows, coherence experiments can be performed between 5 keV < E < 15 keV. First, the energy dependence of spatial coherence properties were determined measuring diffraction at single and double pinholes. Next, the coherent white radiation was used to probe the morphology of thin films in reflection geometry. The recorded intensity maps (reflectivity versus sample position) provide speckle patterns which reveal the locally varying sample morphology. Setting the incident angle, alpha(i), smaller or larger than the critical angle of total external reflection, alpha(c), one should be able to separate the surface height profile from the subsurface density modulation of a sample. The validity of this approach is verified at the example of reciprocal space maps taken from a polymer surface where we could reconstruct the lateral height profile from speckle data. (C) 2004 Elsevier B.V. All rights reserved Y1 - 2005 ER - TY - JOUR A1 - Leitenberger, Wolfram A1 - Pietsch, Ullrich T1 - A monolithic Fresnel bimirror for hard X-rays and its application for coherence measurements N2 - Experiments using a simple X-ray interferometer to measure the degree of spatial coherence of hard X-rays are reported. A monolithic Fresnel bimirror is used at small incidence angles to investigate synchrotron radiation in the energy interval 5-50 keV with monochromatic and white beam. The experimental setup was equivalent to a Young's double-slit experiment for hard X-rays with slit dimensions in the micrometre range. From the high-contrast interference pattern the degree of coherence was determined. Y1 - 2007 UR - http://journals.iucr.org/s/issues/2007/02/00/wl5137/wl5137.pdf U6 - https://doi.org/10.1107/S0909049507003846 SN - 0909-0495 ER - TY - JOUR A1 - Pietsch, Ullrich A1 - Panzner, Tobias A1 - Leitenberger, Wolfram A1 - Vartanyants, Ivan A. T1 - Coherence experiments at the EDR-beamline of BESSY II Y1 - 2005 ER - TY - JOUR A1 - Leitenberger, Wolfram A1 - Wendrock, Horst A1 - Bischoff, Lothar A1 - Weitkamp, Timm T1 - Pinhole interferometry with coherent hard X-rays N2 - This paper discusses the experimental realisation of two types of X-ray interferometer based on pinhole diffraction. In both interferometers the beam splitter was a thin metal foil containing micrometer pinholes to divide the incident X-ray wave into two coherent waves. The interference pattern was studied using an energy-dispersive detector to simultaneously investigate in a large spectral range the diffraction properties of the white synchrotron radiation. For a highly absorbing pinhole mask the interference fringes from the classical Young's double-pinhole experiment were recorded and the degree of coherence of X-rays could be determined. In the case of low absorption of the metal foil at higher X-ray energies (> 15 keV) the interference pattern of a point diffraction interferometer was observed using the same set-up. The spectral refraction index of the metal foil was determined Y1 - 2004 ER - TY - JOUR A1 - Pietsch, Ullrich A1 - Leitenberger, Wolfram A1 - Wendrock, Horst A1 - Bischoff, Lothar A1 - Panzner, Tobias A1 - Grenzer, Jörg A1 - Pucher, Andreas T1 - Double pinhole diffraction of white synchrotron radiation Y1 - 2003 ER - TY - JOUR A1 - Pietsch, Ullrich A1 - Panzner, Tobias A1 - Leitenberger, Wolfram A1 - Grenzer, Jörg A1 - Bodenthin, Th. A1 - Geue, Thomas A1 - Möhwald, Helmuth T1 - Coherence experiments at the energy-dispersive reflectometry beamline at BESSY II Y1 - 2003 ER - TY - JOUR A1 - Abboud, Ali A1 - Send, Sebastian A1 - Pashniak, N. A1 - Leitenberger, Wolfram A1 - Ihle, Sebastian A1 - Huth, M. A1 - Hartmann, Robert A1 - Strüder, Lothar A1 - Pietsch, Ullrich T1 - Sub-pixel resolution of a pnCCD for X-ray white beam applications JF - Journal of instrumentation N2 - A new approach to achieve sub-pixel spatial resolution in a pnCCD detector with 75 x 75 mu m(2) pixel size is proposed for X-ray applications in single photon counting mode. The approach considers the energy dependence of the charge cloud created by a single photon and its split probabilities between neighboring pixels of the detector based on a rectangular model for the charge cloud density. For cases where the charge of this cloud becomes distributed over three or four pixels the center position of photon impact can be reconstructed with a precision better than 2 mu m. The predicted charge cloud sizes are tested at selected X-ray fluorescence lines emitting energies between 6.4 keV and 17.4 keV and forming charge clouds with size (rms) varying between 8 mu m and 10 mu m respectively. The 2 mu m enhanced spatial resolution of the pnCCD is verified by means of an x-ray transmission experiment throughout an optical grating. KW - Solid state detectors KW - Interaction of radiation with matter KW - Detector modelling and simulations II (electric fields, charge transport, multiplication and induction, pulse formation, electron emission, etc) Y1 - 2013 U6 - https://doi.org/10.1088/1748-0221/8/05/P05005 SN - 1748-0221 VL - 8 IS - 3 PB - IOP Publ. Ltd. CY - Bristol ER - TY - JOUR A1 - Leiterer, York A1 - Leitenberger, Wolfram A1 - Emmerling, Franziska A1 - Thünemann, Andreas F. A1 - Panne, Ulrich T1 - The use of an acoustic levitator to follow crystallization in small droplets by energydispersive X-ray diffraction Y1 - 2006 UR - http://journals.iucr.org/j/issues/2006/05/00/wf5016/wf5016.pdf U6 - https://doi.org/10.1107/S0021889806024915 SN - 0021-8898 ER -