TY  - JOUR
A1  - Rabenalt, Thomas
A1  - Richter, Michael
A1  - Pöhl, Frank
A1  - Gössel, Michael
T1  - Highly efficient test response compaction using a hierarchical x-masking technique
JF  - IEEE transactions on computer-aided design of integrated circuits and systems
N2  - This paper presents a highly effective compactor architecture for processing test responses with a high percentage of x-values. The key component is a hierarchical configurable masking register, which allows the compactor to dynamically adapt to and provide excellent performance over a wide range of x-densities. A major contribution of this paper is a technique that enables the efficient loading of the x-masking data into the masking logic in a parallel fashion using the scan chains. A method for eliminating the requirement for dedicated mask control signals using automated test equipment timing flexibility is also presented. The proposed compactor is especially suited to multisite testing. Experiments with industrial designs show that the proposed compactor enables compaction ratios exceeding 200x.
KW  - Design for testability (DFT)
KW  - test response compaction
KW  - X-masking
KW  - X-values
Y1  - 2012
U6  - https://doi.org/10.1109/TCAD.2011.2181847
SN  - 0278-0070
VL  - 31
IS  - 6
SP  - 950
EP  - 957
PB  - Inst. of Electr. and Electronics Engineers
CY  - Piscataway
ER  - 
TY  - THES
A1  - Rabenalt, Thomas
T1  - Datenkompaktierung für Diagnose und Test
Y1  - 2011
CY  - Potsdam
ER  - 
TY  - JOUR
A1  - Rabenalt, Thomas
A1  - Goessel, Michael
A1  - Leininger, Andreas
T1  - Masking of X-Values by use of a hierarchically configurable register
JF  - Journal of electronic testing : theory and applications
N2  - In this paper we consider masking of unknowns (X-values) for VLSI circuits. We present a new hierarchical method of X-masking which is a major improvement of the method proposed in [4], called WIDE1. By the method proposed, the number of observable scan cells is optimized and data volume for X-masking can be significantly reduced in comparison to WIDEL This is demonstrated for three industrial designs. In cases where all X-values have to be masked the novel approach is especially efficient.
KW  - Masking of X-values
KW  - Hierarchically configurable mask register
Y1  - 2011
U6  - https://doi.org/10.1007/s10836-010-5179-2
SN  - 0923-8174
VL  - 27
IS  - 1
SP  - 31
EP  - 41
PB  - Springer
CY  - Dordrecht
ER  -