TY  - JOUR
A1  - Siebrecht, R.
A1  - Schreyer, A.
A1  - Englisch, Uwe
A1  - Pietsch, Ullrich
A1  - Zabel, Hartmut
T1  - The new reflectometer ADAM at the ILL
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Karcenko, Anatolij V.
A1  - Englisch, Uwe
A1  - Grenzer, Jörg
A1  - Geue, Thomas
A1  - Pietsch, Ullrich
A1  - Siebrecht, R.
T1  - Investigation of partially deuterated multilayers by means of X-ray and polarized neutron reflectometry
Y1  - 2000
SN  - 1044-8632
ER  -