TY - JOUR A1 - Chen, Junchao A1 - Lange, Thomas A1 - Andjelkovic, Milos A1 - Simevski, Aleksandar A1 - Krstić, Miloš T1 - Prediction of solar particle events with SRAM-based soft error rate monitor and supervised machine learning JF - Microelectronics reliability N2 - This work introduces an embedded approach for the prediction of Solar Particle Events (SPEs) in space applications by combining the real-time Soft Error Rate (SER) measurement with SRAM-based detector and the offline trained machine learning model. The proposed approach is intended for the self-adaptive fault-tolerant multiprocessing systems employed in space applications. With respect to the state-of-the-art, our solution allows for predicting the SER 1 h in advance and fine-grained hourly tracking of SER variations during SPEs as well as under normal conditions. Therefore, the target system can activate the appropriate mechanisms for radiation hardening before the onset of high radiation levels. Based on the comparison of five different machine learning algorithms trained with the public space flux database, the preliminary results indicate that the best prediction accuracy is achieved with the recurrent neural network (RNN) with long short-term memory (LSTM). Y1 - 2020 U6 - https://doi.org/10.1016/j.microrel.2020.113799 SN - 0026-2714 VL - 114 PB - Elsevier CY - Oxford ER - TY - JOUR A1 - Chen, Junchao A1 - Lange, Thomas A1 - Andjelkovic, Marko A1 - Simevski, Aleksandar A1 - Lu, Li A1 - Krstić, Miloš T1 - Solar particle event and single event upset prediction from SRAM-based monitor and supervised machine learning JF - IEEE transactions on emerging topics in computing / IEEE Computer Society, Institute of Electrical and Electronics Engineers N2 - The intensity of cosmic radiation may differ over five orders of magnitude within a few hours or days during the Solar Particle Events (SPEs), thus increasing for several orders of magnitude the probability of Single Event Upsets (SEUs) in space-borne electronic systems. Therefore, it is vital to enable the early detection of the SEU rate changes in order to ensure timely activation of dynamic radiation hardening measures. In this paper, an embedded approach for the prediction of SPEs and SRAM SEU rate is presented. The proposed solution combines the real-time SRAM-based SEU monitor, the offline-trained machine learning model and online learning algorithm for the prediction. With respect to the state-of-the-art, our solution brings the following benefits: (1) Use of existing on-chip data storage SRAM as a particle detector, thus minimizing the hardware and power overhead, (2) Prediction of SRAM SEU rate one hour in advance, with the fine-grained hourly tracking of SEU variations during SPEs as well as under normal conditions, (3) Online optimization of the prediction model for enhancing the prediction accuracy during run-time, (4) Negligible cost of hardware accelerator design for the implementation of selected machine learning model and online learning algorithm. The proposed design is intended for a highly dependable and self-adaptive multiprocessing system employed in space applications, allowing to trigger the radiation mitigation mechanisms before the onset of high radiation levels. KW - Machine learning KW - Single event upsets KW - Random access memory KW - monitoring KW - machine learning algorithms KW - predictive models KW - space missions KW - solar particle event KW - single event upset KW - machine learning KW - online learning KW - hardware accelerator KW - reliability KW - self-adaptive multiprocessing system Y1 - 2022 U6 - https://doi.org/10.1109/TETC.2022.3147376 SN - 2168-6750 VL - 10 IS - 2 SP - 564 EP - 580 PB - Institute of Electrical and Electronics Engineers CY - [New York, NY] ER - TY - JOUR A1 - Andjelković, Marko A1 - Chen, Junchao A1 - Simevski, Aleksandar A1 - Schrape, Oliver A1 - Krstić, Miloš A1 - Kraemer, Rolf T1 - Monitoring of particle count rate and LET variations with pulse stretching inverters JF - IEEE transactions on nuclear science : a publication of the IEEE Nuclear and Plasma Sciences Society N2 - This study investigates the use of pulse stretching (skew-sized) inverters for monitoring the variation of count rate and linear energy transfer (LET) of energetic particles. The basic particle detector is a cascade of two pulse stretching inverters, and the required sensing area is obtained by connecting up to 12 two-inverter cells in parallel and employing the required number of parallel arrays. The incident particles are detected as single-event transients (SETs), whereby the SET count rate denotes the particle count rate, while the SET pulsewidth distribution depicts the LET variations. The advantage of the proposed solution is the possibility to sense the LET variations using fully digital processing logic. SPICE simulations conducted on IHP's 130-nm CMOS technology have shown that the SET pulsewidth varies by approximately 550 ps over the LET range from 1 to 100 MeV center dot cm(2) center dot mg(-1). The proposed detector is intended for triggering the fault-tolerant mechanisms within a self-adaptive multiprocessing system employed in space. It can be implemented as a standalone detector or integrated in the same chip with the target system. KW - Particle detector KW - pulse stretching inverters KW - single-event transient KW - (SET) count rate KW - SET pulsewidth distribution Y1 - 2021 U6 - https://doi.org/10.1109/TNS.2021.3076400 SN - 0018-9499 SN - 1558-1578 VL - 68 IS - 8 SP - 1772 EP - 1781 PB - Institute of Electrical and Electronics Engineers CY - New York, NY ER - TY - JOUR A1 - Schrape, Oliver A1 - Andjelkovic, Marko A1 - Breitenreiter, Anselm A1 - Zeidler, Steffen A1 - Balashov, Alexey A1 - Krstić, Miloš T1 - Design and evaluation of radiation-hardened standard cell flip-flops JF - IEEE transactions on circuits and systems : a publication of the IEEE Circuits and Systems Society: 1, Regular papers N2 - Use of a standard non-rad-hard digital cell library in the rad-hard design can be a cost-effective solution for space applications. In this paper we demonstrate how a standard non-rad-hard flip-flop, as one of the most vulnerable digital cells, can be converted into a rad-hard flip-flop without modifying its internal structure. We present five variants of a Triple Modular Redundancy (TMR) flip-flop: baseline TMR flip-flop, latch-based TMR flip-flop, True-Single Phase Clock (TSPC) TMR flip-flop, scannable TMR flip-flop and self-correcting TMR flipflop. For all variants, the multi-bit upsets have been addressed by applying special placement constraints, while the Single Event Transient (SET) mitigation was achieved through the usage of customized SET filters and selection of optimal inverter sizes for the clock and reset trees. The proposed flip-flop variants feature differing performance, thus enabling to choose the optimal solution for every sensitive node in the circuit, according to the predefined design constraints. Several flip-flop designs have been validated on IHP's 130nm BiCMOS process, by irradiation of custom-designed shift registers. It has been shown that the proposed TMR flip-flops are robust to soft errors with a threshold Linear Energy Transfer (LET) from (32.4 MeV.cm(2)/mg) to (62.5 MeV.cm(2)/mg), depending on the variant. KW - Single event effect KW - fault tolerance KW - triple modular redundancy KW - ASIC KW - design flow KW - radhard design Y1 - 2021 U6 - https://doi.org/10.1109/TCSI.2021.3109080 SN - 1549-8328 SN - 1558-0806 SN - 1057-7122 VL - 68 IS - 11 SP - 4796 EP - 4809 PB - Inst. of Electr. and Electronics Engineers CY - New York, NY ER - TY - GEN A1 - Andjelkovic, Marko A1 - Babic, Milan A1 - Li, Yuanqing A1 - Schrape, Oliver A1 - Krstić, Miloš A1 - Kraemer, Rolf T1 - Use of decoupling cells for mitigation of SET effects in CMOS combinational gates T2 - 2018 25th IEEE International Conference on Electronics, Circuits and Systems (ICECS) N2 - This paper investigates the applicability of CMOS decoupling cells for mitigating the Single Event Transient (SET) effects in standard combinational gates. The concept is based on the insertion of two decoupling cells between the gate's output and the power/ground terminals. To verify the proposed hardening approach, extensive SPICE simulations have been performed with standard combinational cells designed in IHP's 130 nm bulk CMOS technology. Obtained simulation results have shown that the insertion of decoupling cells results in the increase of the gate's critical charge, thus reducing the gate's soft error rate (SER). Moreover, the decoupling cells facilitate the suppression of SET pulses propagating through the gate. It has been shown that the decoupling cells may be a competitive alternative to gate upsizing and gate duplication for hardening the gates with lower critical charge and multiple (3 or 4) inputs, as well as for filtering the short SET pulses induced by low-LET particles. KW - decoupling cells KW - radiation hardening KW - SET effects KW - CMOS technology KW - combinational logic Y1 - 2019 SN - 978-1-5386-9562-3 U6 - https://doi.org/10.1109/ICECS.2018.8617996 SP - 361 EP - 364 PB - IEEE CY - New York ER - TY - JOUR A1 - Breitenreiter, Anselm A1 - Andjelković, Marko A1 - Schrape, Oliver A1 - Krstić, Miloš T1 - Fast error propagation probability estimates by answer set programming and approximate model counting JF - IEEE Access N2 - We present a method employing Answer Set Programming in combination with Approximate Model Counting for fast and accurate calculation of error propagation probabilities in digital circuits. By an efficient problem encoding, we achieve an input data format similar to a Verilog netlist so that extensive preprocessing is avoided. By a tight interconnection of our application with the underlying solver, we avoid iterating over fault sites and reduce calls to the solver. Several circuits were analyzed with varying numbers of considered cycles and different degrees of approximation. Our experiments show, that the runtime can be reduced by approximation by a factor of 91, whereas the error compared to the exact result is below 1%. KW - Circuit faults KW - Integrated circuit modeling KW - Programming KW - Analytical models KW - Search problems KW - Flip-flops KW - Encoding KW - Answer set programming KW - approximate model counting KW - error propagation KW - radhard design KW - reliability analysis KW - selective fault tolerance KW - single event upsets Y1 - 2022 U6 - https://doi.org/10.1109/ACCESS.2022.3174564 SN - 2169-3536 VL - 10 SP - 51814 EP - 51825 PB - Inst. of Electr. and Electronics Engineers CY - Piscataway ER - TY - JOUR A1 - Li, Yuanqing A1 - Chen, Li A1 - Nofal, Issam A1 - Chen, Mo A1 - Wang, Haibin A1 - Liu, Rui A1 - Chen, Qingyu A1 - Krstić, Miloš A1 - Shi, Shuting A1 - Guo, Gang A1 - Baeg, Sang H. A1 - Wen, Shi-Jie A1 - Wong, Richard T1 - Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree JF - Microelectronics reliability N2 - The soft error rate (SER) due to heavy-ion irradiation of a clock tree is investigated in this paper. A method for clock tree SER prediction is developed, which employs a dedicated soft error analysis tool to characterize the single-event transient (SET) sensitivities of clock inverters and other commercial tools to calculate the SER through fault-injection simulations. A test circuit including a flip-flop chain and clock tree in a 65 nm CMOS technology is developed through the automatic ASIC design flow. This circuit is analyzed with the developed method to calculate its clock tree SER. In addition, this circuit is implemented in a 65 nm test chip and irradiated by heavy ions to measure its SER resulting from the SETs in the clock tree. The experimental and calculation results of this case study present good correlation, which verifies the effectiveness of the developed method. KW - Clock tree KW - Modeling KW - Single-event transient (SET) Y1 - 2018 U6 - https://doi.org/10.1016/j.microrel.2018.05.016 SN - 0026-2714 VL - 87 SP - 24 EP - 32 PB - Elsevier CY - Oxford ER - TY - GEN A1 - Krstić, Miloš A1 - Jentzsch, Anne-Kristin T1 - Reliability, safety and security of the electronics in automated driving vehicles - joint lab lecturing approach T2 - 2018 12TH European Workshop on Microelectronics Education (EWME) N2 - This paper proposes an education approach for master and bachelor students to enhance their skills in the area of reliability, safety and security of the electronic components in automated driving. The approach is based on the active synergetic work of research institutes, academia and industry in the frame of joint lab. As an example, the jointly organized summer school with the respective focus is organized and elaborated. KW - reliability KW - safety KW - security KW - automated driving KW - joint lab Y1 - 2018 SN - 978-1-5386-1157-9 SP - 21 EP - 22 PB - IEEE CY - New York ER - TY - JOUR A1 - Dug, Mehmed A1 - Weidling, Stefan A1 - Sogomonyan, Egor A1 - Jokic, Dejan A1 - Krstić, Miloš T1 - Full error detection and correction method applied on pipelined structure using two approaches JF - Journal of circuits, systems and computers N2 - In this paper, two approaches are evaluated using the Full Error Detection and Correction (FEDC) method for a pipelined structure. The approaches are referred to as Full Duplication with Comparison (FDC) and Concurrent Checking with Parity Prediction (CCPP). Aforementioned approaches are focused on the borderline cases of FEDC method which implement Error Detection Circuit (EDC) in two manners for the purpose of protection of combinational logic to address the soft errors of unspecified duration. The FDC approach implements a full duplication of the combinational circuit, as the most complex and expensive implementation of the FEDC method, and the CCPP approach implements only the parity prediction bit, being the simplest and cheapest technique, for soft error detection. Both approaches are capable of detecting soft errors in the combinational logic, with single faults being injected into the design. On the one hand, the FDC approach managed to detect and correct all injected faults while the CCPP approach could not detect multiple faults created at the output of combinational circuit. On the other hand, the FDC approach leads to higher power consumption and area increase compared to the CCPP approach. KW - Fault tolerance KW - FEDC KW - EDC Y1 - 2020 U6 - https://doi.org/10.1142/S0218126620502187 SN - 0218-1266 SN - 1793-6454 VL - 29 IS - 13 PB - World Scientific CY - Singapore ER - TY - JOUR A1 - Li, Yuanqing A1 - Breitenreiter, Anselm A1 - Andjelkovic, Marko A1 - Chen, Junchao A1 - Babic, Milan A1 - Krstić, Miloš T1 - Double cell upsets mitigation through triple modular redundancy JF - Microelectronics Journal N2 - A triple modular redundancy (TMR) based design technique for double cell upsets (DCUs) mitigation is investigated in this paper. This technique adds three extra self-voter circuits into a traditional TMR structure to enable the enhanced error correction capability. Fault-injection simulations show that the soft error rate (SER) of the proposed technique is lower than 3% of that of TMR. The implementation of this proposed technique is compatible with the automatic digital design flow, and its applicability and performance are evaluated on an FIFO circuit. KW - Triple modular redundancy (TMR) KW - Double cell upsets (DCUs) Y1 - 2019 U6 - https://doi.org/10.1016/j.mejo.2019.104683 SN - 0026-2692 SN - 1879-2391 VL - 96 PB - Elsevier CY - Oxford ER -