TY - JOUR A1 - Ocheretnij, Vitalij A1 - Gössel, Michael A1 - Sogomonyan, Egor S. A1 - Marienfeld, Daniel T1 - Modulo p=3 checking for a carry select adder N2 - In this paper a self-checking carry select adder is proposed. The duplicated adder blocks which are inherent to a carry select adder without error detection are checked modulo 3. Compared to a carry select adder without error detection the delay of the MSB of the sum of the proposed adder does not increase. Compared to a self-checking duplicated carry select adder the area is reduced by 20%. No restrictions are imposed on the design of the adder blocks Y1 - 2006 UR - http://www.springerlink.com/content/100286 U6 - https://doi.org/10.1007/s10836-006-6260-8 ER - TY - JOUR A1 - Singh, Adit D. A1 - Sogomonyan, Egor S. A1 - Gössel, Michael A1 - Seuring, Markus T1 - Testability evaluation of sequential designs incorporating the multi-mode scannable memory element Y1 - 1999 ER - TY - JOUR A1 - Gössel, Michael A1 - Sogomonyan, Egor S. T1 - New totally self-checking ripple and carry look-ahead adders Y1 - 1999 ER - TY - JOUR A1 - Seuring, Markus A1 - Gössel, Michael A1 - Sogomonyan, Egor S. T1 - Ein strukturelles Verfahren zur Kompaktierung von Schaltungsausgaben für online-Fehlererkennungen und Selbstests Y1 - 1998 ER - TY - JOUR A1 - Gössel, Michael A1 - Sogomonyan, Egor S. A1 - Morosov, Andrej T1 - A new totally error propagating compactor for arbitrary cores with digital interfaces Y1 - 1999 ER - TY - JOUR A1 - Gössel, Michael A1 - Sogomonyan, Egor S. T1 - On-line Test auf der Grundlage eines die Parität erhaltenden Signaturanalysators Y1 - 1998 ER - TY - JOUR A1 - Hlawiczka, A. A1 - Gössel, Michael A1 - Sogomonyan, Egor S. T1 - A linear code-preserving signature analyzer COPMISR Y1 - 1997 SN - 0-8186-7810-0 ER - TY - JOUR A1 - Sogomonyan, Egor S. A1 - Singh, Adit D. A1 - Gössel, Michael T1 - A multi-mode scannable memory element for high test application efficiency and delay testing Y1 - 1998 ER - TY - JOUR A1 - Seuring, Markus A1 - Gössel, Michael A1 - Sogomonyan, Egor S. T1 - A structural approach for space compaction for concurrent checking and BIST Y1 - 1998 ER - TY - JOUR A1 - Sogomonyan, Egor S. A1 - Singh, Adit D. A1 - Gössel, Michael T1 - A scan based concrrent BIST approach for low cost on-line testing Y1 - 1998 ER -