TY  - JOUR
A1  - Goessel, Michael
A1  - Chakrabarty, Krishnendu
A1  - Ocheretnij, V.
A1  - Leininger, Andreas
T1  - A signature analysis technique for the identification of failing vectors with application to Scan-BIST
N2  - We present a new technique for uniquely identifying a single failing vector in an interval of test vectors. This technique is applicable to combinational circuits and for scan-BIST in sequential circuits with multiple scan chains. The proposed method relies on the linearity properties of the MISR and on the use of two test sequences, which are both applied to the circuit under test. The second test sequence is derived from the first in a straightforward manner and the same test pattern source is used for both test sequences. If an interval contains only a single failing vector, the algebraic analysis is guaranteed to identify it. We also show analytically that if an interval contains two failing vectors, the probability that this case is interpreted as one failing vector is very low. We present experimental results for the ISCAS benchmark circuits to demonstrate the use of the proposed method for identifying failing test vectors
Y1  - 2004
SN  - 0923-8174
ER  - 
TY  - JOUR
A1  - Rabenalt, Thomas
A1  - Goessel, Michael
A1  - Leininger, Andreas
T1  - Masking of X-Values by use of a hierarchically configurable register
JF  - Journal of electronic testing : theory and applications
N2  - In this paper we consider masking of unknowns (X-values) for VLSI circuits. We present a new hierarchical method of X-masking which is a major improvement of the method proposed in [4], called WIDE1. By the method proposed, the number of observable scan cells is optimized and data volume for X-masking can be significantly reduced in comparison to WIDEL This is demonstrated for three industrial designs. In cases where all X-values have to be masked the novel approach is especially efficient.
KW  - Masking of X-values
KW  - Hierarchically configurable mask register
Y1  - 2011
U6  - https://doi.org/10.1007/s10836-010-5179-2
SN  - 0923-8174
VL  - 27
IS  - 1
SP  - 31
EP  - 41
PB  - Springer
CY  - Dordrecht
ER  -