TY  - JOUR
A1  - Kowarik, Stefan
A1  - Gerlach, Andreas
A1  - Leitenberger, Wolfram
A1  - Hu J, Witte
A1  - Wöll, Christoph
A1  - Schreiber, Frank
T1  - Energy-dispersive X-ray reflectivity and GID for real-time growth studies of pentacene thin films
N2  - We use energy-dispersive X-ray reflectivity and grazing incidence diffraction (GID) to follow the growth of the crystalline organic semiconductor pentacene on silicon oxide in-situ and in real-time. The technique allows for monitoring Bragg reflections and measuring X-ray growth oscillations with a time resolution of 1 min in a wide q-range in reciprocal space extending over 0.25-0.80 angstrom(-1), i.e. sampling a large number of Fourier components simultaneously. A quantitative analysis of growth oscillations at several q-points yields the evolution of the surface roughness, showing a marked transition from layer-by-layer growth to strong roughening after four monolayers of pentacene have been deposited. (c) 2006 Elsevier B.V. All rights reserved.
Y1  - 2007
UR  - http://www.sciencedirect.com/science/journal/00406090
U6  - https://doi.org/10.1016/j.tsf.2006.12.020
SN  - 0040-6090
ER  - 
TY  - JOUR
A1  - Chen, Ziping
A1  - Warsinke, Axel
A1  - Gajovic, Nenad
A1  - Große, St.
A1  - Hu, J.
A1  - Kleber, H.-P.
A1  - Scheller, Frieder W.
T1  - A D-carnitine dehydrogenase electrode for the assessment of enantiomeric purity of L-carnitine preparations
Y1  - 2000
ER  -