TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Gupta, Amod
A1  - Paul, A.
A1  - Meneghini, C.
A1  - Mibu, K.
A1  - Maddalena, S.
A1  - Dal Toe, S.
A1  - Principi, G.
T1  - Structural characterization of epitaxial Fe/Cr multilayers using anomalous x-ray scattering and neutron reflectivity
N2  - The interface structure of epitaxial Fe/Cr multilayers was studied using anomalous X-ray and neutron reflectivity. The analysis of X-ray reflectivity at three different energies provided a reliable information about the interface roughnesses. It is found that the Cr-on-Fc interface is more diffused as compared to the Fe-on-Cr interface and that the roughness exhibits a significant increase with increasing depth. The magnetic roughness, as determined from neutron reflectivity, is lower than the geometrical roughness, in conformity with the behavior of a number of magnetic thin films and multilayers. (C) 2004 Elsevier B.V. All rights reserved
Y1  - 2004
ER  -