TY  - JOUR
A1  - Poloucek, P.
A1  - Pietsch, Ullrich
A1  - Geue, Thomas
A1  - Symietz, Christian
A1  - Brezesinski, Gerald
T1  - X-ray reflectivity analysis of thin complex Langmuir-Blodgett films
Y1  - 2001
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Grenzer, Jörg
A1  - Geue, Thomas
A1  - Neißendorfer, Frank
A1  - Brezesinski, Gerald
A1  - Symietz, Christian
A1  - Möhwald, Helmuth
A1  - Gudat, Wolfgang
T1  - The energy dispersive reflectometer at BESSY II : a challenge for thin film analysis
Y1  - 2001
SN  - 0167- 5087
ER  - 
TY  - JOUR
A1  - Struth, Bernd
A1  - Decher, Gero
A1  - Schmitt, J.
A1  - Hofmeister, Wolfgang
A1  - Neißendorfer, Frank
A1  - Pietsch, Ullrich
A1  - Brezesinski, Gerald
A1  - Möhwald, Helmuth
T1  - Chemical modification of Topaz surfaces
Y1  - 1999
SN  - 0928-4931
ER  -