TY  - JOUR
A1  - Avilov, Anatoly S.
A1  - Kulygin, Alexander K.
A1  - Pietsch, Ullrich
A1  - Spence, John C. H.
A1  - Tsirelson, Vladimir G.
A1  - Zuo, Ming J.
T1  - Scanning system for high-energy electron diffractometry
Y1  - 1999
UR  - http://www3.interscience.wiley.com/journal/118518709/home?CRETRY=1&SRETRY=0
U6  - https://doi.org/10.1107/S0021889899006755
SN  - 0021-8898
ER  - 
TY  - JOUR
A1  - Send, Sebastian
A1  - von Kozierowski, Marc
A1  - Panzner, Tobias
A1  - Gorfman, Semen
A1  - Nurdan, Kivanc
A1  - Walenta, Albert H.
A1  - Pietsch, Ullrich
A1  - Leitenberger, Wolfram
A1  - Hartmann, Robert
A1  - Strüder, Lothar
T1  - Energy-dispersive Laue diffraction by means of a frame-store pnCCD
Y1  - 2009
UR  - http://journals.iucr.org/j/journalhomepage.html
U6  - https://doi.org/10.1107/S0021889809039867
SN  - 0021-8898
ER  - 
TY  - JOUR
A1  - Brajpuriya, Ranjeet
A1  - Tripathi, Sumit
A1  - Sharma, Abhishek
A1  - Chaudhari, S.M.
A1  - Phase, D.M.
A1  - Gupta, Ajay
A1  - Shripathi, Thoudinja
A1  - Leitenberger, Wolfram
A1  - Pietsch, Ullrich
A1  - Laxmi, N.
T1  - Temperature dependent energy-dispersive X-ray diffraction and magnetic study of Fe/Al interface
N2  - In situ temperature dependent energy-dispersive structural and magnetic study of electron beam evaporated Fe/Al multilayer sample (MLS) has been investigated. The structural studies show the formation of an intermixed FeAl transition layer of a few nanometers thick at the interface during deposition, which on annealing at 300 degrees C transforms to B2FeAl intermetallic phase. Magnetization decreases with increase in temperature and drops to minimum above 300 degrees C due to increase in anti-ferromagnetic interlayer coupling and formation of nonmagnetic FeAl phase at the interface. The Curie temperature (T-c) is found to be 288 degrees C and is much less than that of bulk bcc Fe.
Y1  - 2007
UR  - http://www.sciencedirect.com/science/journal/01694332
U6  - https://doi.org/10.1016/j.apsusc.2007.04.069
SN  - 0169-4332
ER  - 
TY  - JOUR
A1  - Reiche, Jürgen
A1  - Pietsch, Ullrich
A1  - Fink, Hans-Peter
A1  - Lemmetyinen, Helge
T1  - A comparison fo x-ray methods for structure refinement of Langmuir-Blodgett multilayers
N2  - The possibilities and limits of structure refinement of Langmuir-Blodgett films by means of symmetrical reflection of X- rays are described using the example of a stearic acid multilayer. Three different techniques for the determiantion of the electron density profile from reflectivity data are compared; a Fourier method, a Patterson method, and model calculations. The important role of the a priori information for finding the besft structure model is outlined.
Y1  - 1992
ER  - 
TY  - JOUR
A1  - Reiche, Jürgen
A1  - Barberka, Thomas Andreas
A1  - Knochenhauer, Gerald
A1  - Woolley, Martin
A1  - Pietsch, Ullrich
T1  - Comprehensive structure investigation and computer modelling of perfluorododecanoic acid multilayers formed by in-vacuo thermal evaporation
Y1  - 1994
ER  - 
TY  - JOUR
A1  - Reiche, Jürgen
A1  - Barberka, Thomas Andreas
A1  - Janietz, Dietmar
A1  - Hofmann, Dieter
A1  - Pietsch, Ullrich
A1  - Brehmer, Ludwig
T1  - X-ray structure investigation and computer modelling of Langmuir-Blodgett films formed from disc-shaped pentaalkines
Y1  - 1994
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Holý, Vaclav
A1  - Strömmer, R.
A1  - Englisch, Uwe
T1  - X-ray and neutron diffuse scattering from multilayers of fatty acid salt molecules
Y1  - 1995
ER  - 
TY  - JOUR
A1  - Reiche, Jürgen
A1  - Knochenhauer, Gerald
A1  - Barberka, Thomas Andreas
A1  - Geue, Thomas
A1  - Pietsch, Ullrich
A1  - Brehmer, Ludwig
A1  - Hodge, P.
A1  - Tredgold, Richard H.
T1  - In-plane structure of perfluorotetra decanoic acid Langmuir-Blodgett films and films formed by vacuum deposition
Y1  - 1995
ER  - 
TY  - JOUR
A1  - Reiche, Jürgen
A1  - Dietzel, Birgit
A1  - Freydank, Anke-Christine
A1  - Geue, Thomas
A1  - Pietsch, Ullrich
A1  - Brehmer, Ludwig
T1  - Lateral structure of thermally treated oxadiazole Langmuir-Blodgett films
Y1  - 1995
ER  - 
TY  - JOUR
A1  - Geue, Thomas
A1  - Stumpe, Joachim
A1  - Pietsch, Ullrich
A1  - Haak, M.
A1  - Kaupp, G.
T1  - Photochemically induced changes of optical anisotropy and surface of LB-multilayers built up by an amphiphilic and liquid crystalline copolymer conating azobenzene moieties
Y1  - 1995
ER  - 
TY  - JOUR
A1  - Englisch, Uwe
A1  - Barberka, Thomas Andreas
A1  - Pietsch, Ullrich
A1  - Höhne, U.
T1  - Investigation of the chain-chain interface in a lead-stearate multilayer using neutron reflectivity
Y1  - 1995
ER  - 
TY  - JOUR
A1  - Reiche, Jürgen
A1  - Penacorada, Florencio
A1  - Geue, Thomas
A1  - Pietsch, Ullrich
A1  - Brehmer, Ludwig
T1  - In-plane structure of uranylarachidate multilayers
Y1  - 1995
ER  - 
TY  - JOUR
A1  - Stahn, Jochen
A1  - Möhle, Marcus
A1  - Pietsch, Ullrich
T1  - Accurate structure determination for GaAs using Pendellösung oscillation
Y1  - 1996
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Hansen, N. K.
T1  - A critical review of the valence charge density in GaAs
Y1  - 1996
ER  - 
TY  - JOUR
A1  - Lichanot, Albert
A1  - Azavant, P.
A1  - Pietsch, Ullrich
T1  - Ab-initio Hartree-Fock study of the electronic charge density of the cubic boron nitride and its comparison with the experiment
Y1  - 1996
ER  - 
TY  - JOUR
A1  - Reiche, Jürgen
A1  - Knochenhauer, Gerald
A1  - Dietel, Reinhard
A1  - Freydank, Anke-Christine
A1  - Zetzsche, Thomas
A1  - Pietsch, Ullrich
A1  - Brehmer, Ludwig
A1  - Barberka, Thomas Andreas
A1  - Geue, Thomas
T1  - Structure of thermally treated oxadiazoleamide Langmuir-Blodgett films
N2  - The thermal treatment of Y-type Langmuir-Blodgett (LB) films formed from the amphiphilic derivative of 2,5- diphenyl-1,3,4-oxadiazole 1 results in changes of the molecular packing. These changes have been analysed by a combination of X-ray specular reflectivity data, X-ray grazing incidence diffraction data and scanning force microscopy images, On the basis of these experimental data we have simulated possible supramolecular structures, These simulations provide insight into the intermolecular interactions giving rise to the observed structural transitions. The crystalline structure induced by thermal treatment of the LB films is characterized by a uniaxial texture, which is correlated with the dipping direction during deposition of the LB film.
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Reiche, Jürgen
A1  - Penacorada, Florencio
A1  - Geue, Thomas
A1  - Pietsch, Ullrich
A1  - Brehmer, Ludwig
T1  - Monolayers and multilayers of uranyl arachidate : in-plane structure of uranyl arachidate multilayers
N2  - The molecular in-plane structure of uranyl arachidate Langmuir-Blodgett (LB) films formed at different subphase pH values was analysed by means of X-ray grazing-incidence diffraction. For multilayers formed at low subphase pH a reorganisation of the arachidic acid film structure is confirmed. At appropriate subphase pH values, reorganisation of the film structure, e.g. via the formation of three-dimensional crystallites, is prevented by the presence of the uranyl ions and by the subsequent introduction of conformational disorder (gauche defects) in the alkyl chains. The observation of a macroscopic flow-induced in-plane texture in these uranyl arachidate LB films has profound implications for the design of ordered, supramolecular structures by the Langmuir-Blodgett technique.
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Barberka, Thomas Andreas
A1  - Geue, Thomas
A1  - Stömmer, Ralph
T1  - X-ray scattering from thin organic films and multilayers
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Englisch, Uwe
A1  - Gutberlet, T.
A1  - Seitz, R.
A1  - Oeser, R.
A1  - Pietsch, Ullrich
T1  - Thermally induced rearrangement of fatty acid salt molecules in Langmuir-Blodgett multilayers
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Darowski, Nora
A1  - Paschke, K.
A1  - Pietsch, Ullrich
A1  - Wang, K. H.
A1  - Forchel, Alfred
A1  - Baumbach, Tilo
A1  - Zeimer, Ute
T1  - Identification of a buried single quantum well within surface structurized semiconductors using depth resolved x-ray grazing-incidence diffraction
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Rose, Dirk
A1  - Pietsch, Ullrich
A1  - Zeimer, Ute
T1  - Characterization of InGaAs single quantum wells buried in GaAs[001] by grazing incidence diffraction
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Bolm, A.
A1  - Englisch, Uwe
A1  - Penacorada, Florencio
A1  - Gerstenberger, M.
A1  - Pietsch, Ullrich
T1  - Temperature and time dependent investigations of cd- and uranyl-stearate multilayers by means of neutron reflectivity measurements
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Herrmann, A.
A1  - Kaupp, G.
A1  - Geue, Thomas
A1  - Pietsch, Ullrich
T1  - AFM and GID investigations of the gas-solid diazotation of 4-sulfanil-acid-monohydrat single crystals
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Paschke, K.
A1  - Geue, Thomas
A1  - Barberka, Thomas Andreas
A1  - Bolm, A.
A1  - Pietsch, Ullrich
A1  - Rösch, M.
A1  - Batke, Edwin
A1  - Faller, F.
A1  - Kerkel, K.
A1  - Oshiniwo, J.
A1  - Forchel, Alfred
T1  - Characterization of lateral semiconductor nano structures by means of x-ray grazing-incidence diffraction
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Siebrecht, R.
A1  - Schreyer, A.
A1  - Englisch, Uwe
A1  - Pietsch, Ullrich
A1  - Zabel, Hartmut
T1  - The new reflectometer ADAM at the ILL
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Neißendorfer, Frank
A1  - Bolm, A.
A1  - Pietsch, Ullrich
T1  - Energy dispersive X-ray reflectometry and X-ray grazing incidence diffraction from organic multilayers
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Darowski, Nora
A1  - Pietsch, Ullrich
A1  - Wang, K. H.
A1  - Forchel, Alfred
A1  - Shen, W.
A1  - Kycia, S.
T1  - X-ray diffraction analysis of strain relaxation in free standing and buried GaAs/GaInAs/GaAs SQW lateral structures
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Haier, P.
A1  - Herrmann, B. A.
A1  - Esser, N.
A1  - Pietsch, Ullrich
A1  - Lüders, K.
A1  - Richter, W.
T1  - Influence of the deposition rate on the structure of thin metal layers
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Stahn, Jochen
A1  - Pucher, Andreas
A1  - Geue, Thomas
A1  - Daniel, A.
A1  - Pietsch, Ullrich
T1  - Electric field induced electron density response of GaAs and ZnSe
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Darowski, Nora
A1  - Lübbert, Daniel
A1  - Pietsch, Ullrich
A1  - Zhuang, Y.
A1  - Zerlauth, S.
A1  - Bauer, Günther
T1  - In-plane strain and strain relaxation in laterally patterned Si/SiGe quantum dots and wire arrays
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Stömmer, Ralph
A1  - Göbel, H.
A1  - Hub, W.
A1  - Pietsch, Ullrich
T1  - X-ray scattering from silicon surfaces
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Stömmer, Ralph
A1  - Martin, C. R.
A1  - Geue, Thomas
A1  - Göbel, H.
A1  - Hub, W.
A1  - Pietsch, Ullrich
T1  - Comparative studies of fractal parameters of Si(100) surfaces measured by X-ray scattering and atomic force microscopy
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Darowski, Nora
A1  - Pietsch, Ullrich
A1  - Zeimer, Ute
A1  - Smirnitzki, V.
A1  - Bugge, F.
T1  - Nondestructive analysis of a lateral GaAs nanostructure buried under AlGaAs using conventional high resolution and grazing incidence X-ray diffraction
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Darowski, Nora
A1  - Paschke, K.
A1  - Pietsch, Ullrich
A1  - Wang, K. H.
A1  - Forchel, Alfred
A1  - Lübbert, Daniel
A1  - Baumbach, Tilo
T1  - Structural characterization of a GaAs surface wire structure by triple-axis X-ray grazing incidence diffraction
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Ulyanenkov, A.
A1  - Klemradt, U.
A1  - Pietsch, Ullrich
T1  - Investigation of strain relaxation in GaInAs/GaAs superlattices by x-ray diffuse scattering
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Grenzer, Jörg
A1  - Schomburg, E.
A1  - Lingott, I.
A1  - Ignotov, A. a.
A1  - Renk, K. F.
A1  - Pietsch, Ullrich
A1  - Rose, Dirk
A1  - Zeimer, Ute
A1  - Melzer, B. J.
A1  - Ivanov, S.
A1  - Schaposchnikov, S.
A1  - Kop'ev, P. S.
A1  - Pavel'ev, D. G.
A1  - Koschurinov, Yu.
T1  - X-ray and transport characterization of an Esaki-Tsu superlattice device
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Stahn, Jochen
A1  - Möhle, Marcus
A1  - Pietsch, Ullrich
T1  - Comparison of theoretical and experimental structure amplitudes of GaAs
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Tsirelson, Vladimir G.
A1  - Abramov, Yury Fedorovich
A1  - Zavodnik, Valerie E.
A1  - Stash, Adam I.
A1  - Belokoneva, Elena L.
A1  - Stahn, Jochen
A1  - Pietsch, Ullrich
A1  - Feil, Dirk
T1  - Critical pionts in a crystal an procrystal
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Englisch, Uwe
A1  - Penacorada, Florencio
A1  - Samoilenko, I.
A1  - Pietsch, Ullrich
T1  - Investigation of the vertical molecular exchange in a complex organic multilayer system
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Zhuang, Y.
A1  - Holý, Václav
A1  - Stangl, Jochen
A1  - Darhuber, A.
A1  - Mikulik, P.
A1  - Zerlauth, S.
A1  - Schäffler, F.
A1  - Bauer, Günther
A1  - Darowski, Nora
A1  - Lübbert, Daniel
A1  - Pietsch, Ullrich
T1  - Strain relaxation in periodic arrays of Si/SiGe quantum wires determined by coplanar high-resolution x-ray diffrcation and grazing-incidence diffraction
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Zeimer, Ute
A1  - Baumbach, Tilo
A1  - Grenzer, Jörg
A1  - Lübbert, Daniel
A1  - Mazuelas, A.
A1  - Pietsch, Ullrich
A1  - Erbert, G.
T1  - In-situ characterization of strain distribution in broad-area high-power lasers under operation by high- resolution x-ray diffrcation and topography using synchrotron radiation
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Englisch, Uwe
A1  - Katholy, Stefan
A1  - Penacorada, Florencio
A1  - Reiche, Jürgen
A1  - Pietsch, Ullrich
T1  - Investigation of molecular diffusion across organic multilayers using neutron specular reflectivity
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Ulyanenkov, A.
A1  - Darowski, Nora
A1  - Grenzer, Jörg
A1  - Pietsch, Ullrich
A1  - Wang, K. H.
A1  - Forchel, Alfred
T1  - Evaluation of strain distribution in freestanding and bruied lateral nanostructures
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Stahn, Jochen
A1  - Pucher, Andreas
A1  - Pietsch, Ullrich
A1  - Zellner, J.
A1  - Weckert, E.
T1  - Experimental determination of electric field induced differences in structure factor phases in the order of 2%
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Veldkamp, Markus
A1  - Erko, Alexei
A1  - Gudat, Wolfgang
A1  - Abrosimov, Nikolai V.
A1  - Alex, Volker
A1  - Khasanov, Salavat
A1  - Neissendorfer, Frank
A1  - Pietsch, Ullrich
A1  - Shekhtman, Veniamin
T1  - Si(1-x)Ge(x) laterally graded crystals as monochromators for X-Ray absorption spectroscopy studies
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Ulyanenkov, A.
A1  - Baumbach, Tilo
A1  - Darowski, Nora
A1  - Pietsch, Ullrich
A1  - Wang, K. H.
A1  - Forchel, Alfred
A1  - Wiebach, T.
T1  - Investigation of the in-plane strain distribution in free-standing GaAs/InGaAs/GaAs single quantum well surface nanostructures on GaAs[001]
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Holý, Václav
A1  - Darhuber, A.
A1  - Stangl, Jochen
A1  - Zerlauth, S.
A1  - Schäffler, F.
A1  - Bauer, Günther
A1  - Darowski, Nora
A1  - Lübbert, Daniel
A1  - Pietsch, Ullrich
A1  - Vavra, I.
T1  - HRXRD and GID investigations of a self-organized SiGe quantum dot multilayer
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Neißendorfer, Frank
A1  - Pietsch, Ullrich
A1  - Breszisinski, G.
A1  - Möhwald, Helmuth
T1  - Energy-dispersive reflectometry and diffractometry at the WLS of BESSY-I
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Lübbert, Daniel
A1  - Baumbach, Tilo
A1  - Ponti, S.
A1  - Pietsch, Ullrich
A1  - Leprince, L.
A1  - Schneck, J.
A1  - Talneau, A.
T1  - Strain investigation of low strained buried gratings by grazing incidence X-Ray diffraction and the theory of elasticity
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Geue, Thomas
A1  - Schultz, M.
A1  - Englisch, Uwe
A1  - Stömmer, Ralph
A1  - Pietsch, Ullrich
A1  - Meine, Kerstin
A1  - Vollhard, D.
T1  - Investigation of pH-dependent domain structure of fatty acid salt Langmuir-Blodgett films by means of X-ray diffuse scattering and Atomic Force Microscopy
Y1  - 1999
ER  -