TY - JOUR A1 - Reiche, Jürgen A1 - Barberka, Thomas Andreas A1 - Janietz, Dietmar A1 - Hofmann, Dieter A1 - Pietsch, Ullrich A1 - Brehmer, Ludwig T1 - X-ray structure investigation and computer modelling of Langmuir-Blodgett films formed from disc-shaped pentaalkines Y1 - 1994 ER - TY - JOUR A1 - Pietsch, Ullrich A1 - Barberka, Thomas Andreas A1 - Geue, Thomas A1 - Stömmer, Ralph T1 - X-ray scattering from thin organic films and multilayers Y1 - 1997 ER - TY - JOUR A1 - Stömmer, Ralph A1 - Göbel, H. A1 - Hub, W. A1 - Pietsch, Ullrich T1 - X-ray scattering from silicon surfaces Y1 - 1998 ER - TY - JOUR A1 - Pietsch, Ullrich A1 - Tsirelson, Vladimir G. A1 - Gorfan, S. V. T1 - X-ray scattering amplitude of an atom in a permanent external electric field Y1 - 2003 ER - TY - JOUR A1 - Pietsch, Ullrich A1 - Kubowicz, Stephan A1 - Thünemann, Andreas F. A1 - Geue, Thomas A1 - Watson, M. D. A1 - Tchebotareva, N. A1 - Müllen, K. T1 - X-ray reflectivity study of an amphiphilic hex-peri-hexabenzocoronene at a structured silicon wafer surface Y1 - 2003 ER - TY - JOUR A1 - Geue, Thomas A1 - Henneberg, Oliver A1 - Pietsch, Ullrich T1 - X-ray reflectivity from sinusoidal surface relief gratings Y1 - 2002 SN - 0023-4753 ER - TY - JOUR A1 - Pietsch, Ullrich T1 - X-ray reflectivity from sinusoidal surface relief gratings Y1 - 2002 ER - TY - JOUR A1 - Poloucek, P. A1 - Pietsch, Ullrich A1 - Geue, Thomas A1 - Symietz, Christian A1 - Brezesinski, Gerald T1 - X-ray reflectivity analysis of thin complex Langmuir-Blodgett films Y1 - 2001 ER - TY - JOUR A1 - Pietsch, Ullrich A1 - Geue, Thomas A1 - Henneberg, Oliver A1 - Saphiannikova, Marina T1 - X-ray investigations of formation efficiency of buried azobenzene polymer density gratings Y1 - 2003 UR - http://scitation.aip.org/journals/doc/JAPIAU-ft/vol_93/iss_6/3161_1.html U6 - https://doi.org/10.1063/1.1554753 ER - TY - JOUR A1 - Pietsch, Ullrich A1 - Hesse, A. A1 - Zhuang, Y. A1 - Holý, Vaclav A1 - Stangl, Jochen A1 - Zerlauth, S. A1 - Schaffler, F. A1 - Bauer, Günther T1 - X-ray grazing-incidence study of inhomogeneous strain relaxation in Si/SiGe wires Y1 - 2003 SN - 0168-583X ER - TY - JOUR A1 - Gorfman, S. V. A1 - Tsirelson, Vladimir G. A1 - Pietsch, Ullrich T1 - X-ray diffraction by a crystal in a permanent external electric field : general considerations N2 - The variations of X-ray diffraction intensities from a crystal in the presence of a permanent external electric field is modeled analytically using a first-order stationary perturbation theory. The change in a crystal, induced by an external electric field, is separated into two contributions. The first one is related to a pure polarization of an electron subsystem, while the second contribution can be reduced to the displacements of the rigid pseudoatoms from their equilibrium positions. It is shown that a change of the X-ray diffraction intensities mainly originates from the second contribution, while the influence of the pure polarization of a crystal electron subsystem is negligibly small. The quantities restored from an X-ray diffraction experiment in the presence of an external electric field were analyzed in detail in terms of a rigid pseudoatomic model of electron density and harmonic approximation for the atomic thermal motion. Explicit relationships are derived that link the properties of phonon spectra with E-field-induced variations of a structure factor, pseudoatomic displacements and piezoelectric strains. The displacements can be numerically estimated using a model of independent atomic motion if the Debye - Waller factors and pseudoatomic charges are known either from a previous single-crystal X-ray diffraction study or from density functional theory calculations. The above estimations can be used to develop an optimum strategy for a data collection that avoids the measurements of reflections insensitive to the electric-field-induced variations Y1 - 2005 SN - 0108-7673 ER - TY - JOUR A1 - Gorfman, Semen A1 - Tsirelson, Vladimir A1 - Pucher, Andreas A1 - Morgenroth, Wolfgang A1 - Pietsch, Ullrich T1 - X-ray diffraction by a crystal in a permanent external electric field : electric-field-induced structural response in alpha-GaPO4 N2 - For the first time, site-selective distortion has been investigated for two different structural units in the ternary compound alpha-GaPO4 under the influence of a permanent external electric field. Based on 54 measured reflection intensities, the electric-field-induced distortion of PO4 and GaO4 tetrahedra in alpha-GaPO4 crystals is evaluated using a model of pseudoatomic displacements introduced recently [Gorfman, Tsirelson & Pietsch (2005). Acta Cryst. A61, 387- 396]. A stronger variation of the P-O bond lengths in the PO4 tetrahedron was found compared to the bonds in the GaO4 tetrahedron. The different distortions of the tetrahedra owing to the electric field were analysed in terms of the valence charge density of alpha-GaPO4 and its topological characteristics. The larger charge of the P pseudoatom compared to the Ga atom was recognized as the main reason for the higher sensitivity of the PO4 tetrahedron to a permanent external electric field Y1 - 2006 UR - http://onlinelibrary.wiley.com/journal/10.1111/(ISSN)1600-5724 U6 - https://doi.org/10.1107/S0108767305036111 SN - 0108-7673 ER - TY - JOUR A1 - Darowski, Nora A1 - Pietsch, Ullrich A1 - Wang, K. H. A1 - Forchel, Alfred A1 - Shen, W. A1 - Kycia, S. T1 - X-ray diffraction analysis of strain relaxation in free standing and buried GaAs/GaInAs/GaAs SQW lateral structures Y1 - 1998 ER - TY - JOUR A1 - Henneberg, Oliver A1 - Geue, Thomas A1 - Saphiannikova, Marina A1 - Pietsch, Ullrich A1 - Rochon, Paul T1 - X-ray and VIS light scattering from light-induced polymer gratings Y1 - 2003 UR - http://stacks.iop.org/0022-3727/36/A241 U6 - https://doi.org/10.1088/0022-3727/36/10A/350 ER - TY - JOUR A1 - Henneberg, Oliver A1 - Panzner, Tobias A1 - Pietsch, Ullrich A1 - Geue, Thomas A1 - Saphiannikova, Marina A1 - Rochon, Paul A1 - Finkelstein, Kenneth D. T1 - X-ray and VIS light scattering from light-induced polymer gratings N2 - Sinusoidally shaped surface relief gratings made of polymer films containing, azobenzene moieties can be created by holographic illumination with laser light of about lambda approximate to 500 nm. The remarkable material transport takes place at temperatures far (100 K) below the glass transition temperature of the material. As probed by visible light scattering the efficiency of grating formation crucially depends on the polarization state of the laser light and is maximal when circular polarization is used. In contrast to VIS light scattering X-ray diffraction is most sensitive for periodic surface undulations with amplitudes below 10 nm. Thus, combined in-situ X-ray and visible light scattering at CHESS were used to investigate the dynamics of surface relief grating formations upon laser illumination. The time development of grating peaks up to 9th order at laser power of P = 20 mW/cm(2) could be investigated, even the onset of grating formation as a function of light polarization. A linear growth of grating amplitude was observed for all polarizations. The growth velocity is maximal using circularly polarized light but very small for s-polarized light Y1 - 2004 UR - 1960 = doi:10.1524/zkri.219.4.218.30438 SN - 0044-2968 ER - TY - JOUR A1 - Grenzer, Jörg A1 - Schomburg, E. A1 - Lingott, I. A1 - Ignotov, A. a. A1 - Renk, K. F. A1 - Pietsch, Ullrich A1 - Rose, Dirk A1 - Zeimer, Ute A1 - Melzer, B. J. A1 - Ivanov, S. A1 - Schaposchnikov, S. A1 - Kop'ev, P. S. A1 - Pavel'ev, D. G. A1 - Koschurinov, Yu. T1 - X-ray and transport characterization of an Esaki-Tsu superlattice device Y1 - 1998 ER - TY - JOUR A1 - Englisch, Uwe A1 - Penacorada, Florencio A1 - Brehmer, Ludwig A1 - Pietsch, Ullrich T1 - X-ray and neutron reflection analysis of the structure and the molecular exchange process in simple and complex fatty acid salt Langmuir-Blodgett multilayers Y1 - 1999 ER - TY - JOUR A1 - Pietsch, Ullrich A1 - Holý, Vaclav A1 - Strömmer, R. A1 - Englisch, Uwe T1 - X-ray and neutron diffuse scattering from multilayers of fatty acid salt molecules Y1 - 1995 ER - TY - JOUR A1 - Pietsch, Ullrich A1 - Jarre, A. A1 - Salditt, T. A1 - Panzner, Tobias A1 - Pfeiffer, F. T1 - White beam x-ray waveguide optics N2 - We report a white beam x-ray waveguide (WG) experiment. A resonant beam coupler x-ray waveguide (RBC) is used simultaneously as a broad bandpass (or multibandpass) monochromator and as a beam compressor. We show that, depending on the geometrical properties of the WG, the exiting beam consists of a defined number of wavelengths which can be shifted by changing the angle of incidence of the white x-ray synchrotron beam. The characteristic far-field pattern is recorded as a function of exit angle and energy. This x-ray optical setup may be used to enhance the intensity of coherent x-ray WG beams since the full energetic acceptance of the WG mode is transmitted. (C) 2004 American Institute of Physics Y1 - 2004 ER - TY - JOUR A1 - Thünemann, Andreas F. A1 - Kubowicz, Stephan A1 - Pietsch, Ullrich T1 - Ultra-thin solid polyelectrolyte-surfactant complex films : structure and wetting Y1 - 2000 ER - TY - JOUR A1 - Pietsch, Ullrich A1 - Mukhopadhyay, M. K. A1 - Sanyal, M. K. A1 - Datta, A. A1 - Mukherjee, M. A1 - Geue, Thomas A1 - Grenzer, Jörg T1 - Transition from two-dimensional to three-dimensional melting in Langmuir-Blodgett films N2 - Results of energy-dispersive x-ray reflectivity and grazing incidence diffraction studies of Langmuir-Blodgett films exhibited evolution of conventional three-dimensional melting from continuous melting, characteristic of two- dimensional systems, as a function of deposited monolayers. Continuous expansion followed by a sharp phase transition of the in-plane lattice was observed before the melting point and found to be independent of number of deposited layers. Evolution of conventional melting with an increase in the number of monolayers could be quantified by measuring stiffness against tilting of the vertical stack of molecules, which are kept together by an internal field. The internal field as defined in this model reduces as the in-plane lattice expands and the sample temperature approaches melting point. The sharpness of the melting transition, which has been approximated by a Langevin function, increases with the number of deposited monolayers Y1 - 2004 ER - TY - JOUR A1 - Pietsch, Ullrich T1 - Thin Layers of columns of an amphiphilic hexa-peri-hexabenzocoronene at silicon wafer surfaces Y1 - 2003 ER - TY - JOUR A1 - Englisch, Uwe A1 - Gutberlet, T. A1 - Seitz, R. A1 - Oeser, R. A1 - Pietsch, Ullrich T1 - Thermally induced rearrangement of fatty acid salt molecules in Langmuir-Blodgett multilayers Y1 - 1997 ER - TY - JOUR A1 - Pietsch, Ullrich A1 - Grigorian, Souren A. A1 - Grenzer, Jörg A1 - Vartanyants, Ivan A. T1 - Thermal diffuse scattering in grazing incidence diffraction Y1 - 2003 ER - TY - JOUR A1 - Siebrecht, R. A1 - Schreyer, A. A1 - Englisch, Uwe A1 - Pietsch, Ullrich A1 - Zabel, Hartmut T1 - The new reflectometer ADAM at the ILL Y1 - 1997 ER - TY - JOUR A1 - Pietsch, Ullrich A1 - Grenzer, Jörg A1 - Geue, Thomas A1 - Neißendorfer, Frank A1 - Brezesinski, Gerald A1 - Symietz, Christian A1 - Möhwald, Helmuth A1 - Gudat, Wolfgang T1 - The energy dispersive reflectometer at BESSY II : a challenge for thin film analysis Y1 - 2001 SN - 0167- 5087 ER - TY - JOUR A1 - Pietsch, Ullrich A1 - Davaasambuu, Jav A1 - Kochin, V. A1 - Schwarz, K. H. A1 - Blaha, Pawel T1 - The atomistic origin of the inverse piezoelectric effect in a-quartz N2 - Ab initio calculations have been carried out using the FP-APW+lo method in order to understand the atomic origin of the inverse piezoelectric effect in x-quartz. The external electric field was modelled by a saw-like potential V-ext in order to achieve translational symmetry within a supercell (SC) containing 72 atoms. The original trigonal quartz structure was repeated along the [110] direction, which corresponds to the direction of the external field. An electric field with 550 kV/mm was applied and the atomic positions of the SC were relaxed until the forces acting on the atoms vanished. In parts of the SC, V-ext changes almost linearly and thus the relaxed atomic positions can be used to determine the structural response due to the external electric field. The calculations provide the piezoelectric modulus of the correct order of magnitude. In contrast to previous models and in agreement with recent experimental results, the atomic origin of the piezoelectric effect can be described by a rotation of slightly deformed SiO4 tetrahedra against each other. The change of the Si-O bond lengths and the tetrahedral O-Si-O angles is one order of magnitude smaller than that of the Si-O-Si angles between neighbouring tetrahedra. The calculated changes of X-ray structure factors are in agreement with experiment when the theoretical data are extrapolated down to the much smaller field strength that is applied in the experiment (E < 10 kV/mm). (C) 2004 Elsevier Ltd. All rights reserved Y1 - 2004 ER - TY - JOUR A1 - Mukherjee, M. A1 - Bhattacharya, M. K. A1 - Sanyal, M. K. A1 - Geue, Thomas A1 - Grenzer, Jörg A1 - Pietsch, Ullrich T1 - Temperature dependent thickness and surface tension of polymer films Y1 - 2000 SN - 81-7371295-6 ER - TY - JOUR A1 - Brajpuriya, Ranjeet A1 - Tripathi, Sumit A1 - Sharma, Abhishek A1 - Chaudhari, S.M. A1 - Phase, D.M. A1 - Gupta, Ajay A1 - Shripathi, Thoudinja A1 - Leitenberger, Wolfram A1 - Pietsch, Ullrich A1 - Laxmi, N. T1 - Temperature dependent energy-dispersive X-ray diffraction and magnetic study of Fe/Al interface N2 - In situ temperature dependent energy-dispersive structural and magnetic study of electron beam evaporated Fe/Al multilayer sample (MLS) has been investigated. The structural studies show the formation of an intermixed FeAl transition layer of a few nanometers thick at the interface during deposition, which on annealing at 300 degrees C transforms to B2FeAl intermetallic phase. Magnetization decreases with increase in temperature and drops to minimum above 300 degrees C due to increase in anti-ferromagnetic interlayer coupling and formation of nonmagnetic FeAl phase at the interface. The Curie temperature (T-c) is found to be 288 degrees C and is much less than that of bulk bcc Fe. Y1 - 2007 UR - http://www.sciencedirect.com/science/journal/01694332 U6 - https://doi.org/10.1016/j.apsusc.2007.04.069 SN - 0169-4332 ER - TY - JOUR A1 - Bodenthin, Yves A1 - Grenzer, Jörg A1 - Lauter, Robert A1 - Pietsch, Ullrich A1 - Lehmann, Pit A1 - Kurth, Dirk G. A1 - Möhwald, Helmuth T1 - Temperature and time resolved x-ray scattering at thin organic films Y1 - 2002 ER - TY - JOUR A1 - Bolm, A. A1 - Englisch, Uwe A1 - Penacorada, Florencio A1 - Gerstenberger, M. A1 - Pietsch, Ullrich T1 - Temperature and time dependent investigations of cd- and uranyl-stearate multilayers by means of neutron reflectivity measurements Y1 - 1997 ER - TY - JOUR A1 - Mukhopadhyay, M. K. A1 - Datta, A. A1 - Sanyal, M. K. A1 - Geue, Thomas A1 - Pietsch, Ullrich T1 - Synchrotron Studies of Melting of Langmuir-Blodgett Films Y1 - 2001 ER - TY - JOUR A1 - Pietsch, Ullrich A1 - Panzner, Tobias A1 - Pfeiffer, Franz A1 - Robinson, Ian K. T1 - Substrate morphology repetition in "thick" polymer films N2 - Using Grazing-incidence small-angle scattering (GISAXS) technique we investigated the surface morphology of polymer films spin-coated on different silicon substrates. As substrates we used either technologically smooth silicon wafers or the same silicon wafer coated with thin aluminium or gold films which show a granular structure at the surface. Although the polymer thickness exceeds 300 nm the GISAXS pattern of the film shows the same in-plane angle distribution Delta2theta as the underlying substrate. Annealing the polymer films at a temperature above its glass transition temperature Delta2theta changed from a broad to a narrow distribution as it is typically for films on pure silicon. The experiment can be interpreted by roughness replication and density fluctuation within the polymer film created while spin-coating at room temperature. Due to the low segment mobility there are density fluctuations which repeat the surface morphology of the substrate. Above the glass temperature the polymer density can be homogenized independently from the morphology of the substrate. (C) 2004 Elsevier B.V. All rights reserved Y1 - 2005 ER - TY - JOUR A1 - Abboud, Ali A1 - Send, Sebastian A1 - Pashniak, N. A1 - Leitenberger, Wolfram A1 - Ihle, Sebastian A1 - Huth, M. A1 - Hartmann, Robert A1 - Strüder, Lothar A1 - Pietsch, Ullrich T1 - Sub-pixel resolution of a pnCCD for X-ray white beam applications JF - Journal of instrumentation N2 - A new approach to achieve sub-pixel spatial resolution in a pnCCD detector with 75 x 75 mu m(2) pixel size is proposed for X-ray applications in single photon counting mode. The approach considers the energy dependence of the charge cloud created by a single photon and its split probabilities between neighboring pixels of the detector based on a rectangular model for the charge cloud density. For cases where the charge of this cloud becomes distributed over three or four pixels the center position of photon impact can be reconstructed with a precision better than 2 mu m. The predicted charge cloud sizes are tested at selected X-ray fluorescence lines emitting energies between 6.4 keV and 17.4 keV and forming charge clouds with size (rms) varying between 8 mu m and 10 mu m respectively. The 2 mu m enhanced spatial resolution of the pnCCD is verified by means of an x-ray transmission experiment throughout an optical grating. KW - Solid state detectors KW - Interaction of radiation with matter KW - Detector modelling and simulations II (electric fields, charge transport, multiplication and induction, pulse formation, electron emission, etc) Y1 - 2013 U6 - https://doi.org/10.1088/1748-0221/8/05/P05005 SN - 1748-0221 VL - 8 IS - 3 PB - IOP Publ. Ltd. CY - Bristol ER - TY - JOUR A1 - Reiche, Jürgen A1 - Knochenhauer, Gerald A1 - Dietel, Reinhard A1 - Freydank, Anke-Christine A1 - Zetzsche, Thomas A1 - Pietsch, Ullrich A1 - Brehmer, Ludwig A1 - Barberka, Thomas Andreas A1 - Geue, Thomas T1 - Structure of thermally treated oxadiazoleamide Langmuir-Blodgett films N2 - The thermal treatment of Y-type Langmuir-Blodgett (LB) films formed from the amphiphilic derivative of 2,5- diphenyl-1,3,4-oxadiazole 1 results in changes of the molecular packing. These changes have been analysed by a combination of X-ray specular reflectivity data, X-ray grazing incidence diffraction data and scanning force microscopy images, On the basis of these experimental data we have simulated possible supramolecular structures, These simulations provide insight into the intermolecular interactions giving rise to the observed structural transitions. The crystalline structure induced by thermal treatment of the LB films is characterized by a uniaxial texture, which is correlated with the dipping direction during deposition of the LB film. Y1 - 1997 ER - TY - JOUR A1 - Pietsch, Ullrich A1 - Bodenthin, Yves A1 - Grenzer, Jörg A1 - Geue, Thomas A1 - Möhwald, Helmuth A1 - Kurth, Dirk G. T1 - Structure and temperature behavior of metallo-supramolecular assemblies N2 - A detailed structural analysis of a Langmuir-Blodgett (LB) multilayer composed of a polyelectrolyte-amphiphile complex (PAC) is presented. The PAC is self-assembled from metal ions, ditopic bis-terpyridines, and amphiphiles. The vertical structure of the LB multilayer is investigated by X-ray reflectometry. The multilayer has a periodicity of 57 A, which corresponds to an architecture of flat lying metallo-supramolecular coordination polyelectrolyte (MEPE) rods and upright-standing amphiphiles (dihexadecyl phosphate, DHP). In-plane diffraction reveals hexagonal packing of the DHP molecules. Using extended X-ray absorption fine structure (EXAFS) experiments, we prove that the central metal ion is coordinated to the terpyridine moieties in a pseudo-octahedral coordination environment. The Fe-N bond distances are 1.82 and 2.0 angstrom, respectively. Temperature resolved measurements indicate a reversible phase transition in a temperature range up to 55 degrees C. EXAFS measurements indicate a lengthening of the average Fe-N bond distance from 1.91 to 1.95 angstrom. The widening of the coordination cage upon heating is expected to lower the ligand field stabilization, thus giving rise to spin transitions in these composite materials Y1 - 2005 ER - TY - JOUR A1 - Pietsch, Ullrich A1 - Gupta, Amod A1 - Paul, A. A1 - Meneghini, C. A1 - Mibu, K. A1 - Maddalena, S. A1 - Dal Toe, S. A1 - Principi, G. T1 - Structural characterization of epitaxial Fe/Cr multilayers using anomalous x-ray scattering and neutron reflectivity N2 - The interface structure of epitaxial Fe/Cr multilayers was studied using anomalous X-ray and neutron reflectivity. The analysis of X-ray reflectivity at three different energies provided a reliable information about the interface roughnesses. It is found that the Cr-on-Fc interface is more diffused as compared to the Fe-on-Cr interface and that the roughness exhibits a significant increase with increasing depth. The magnetic roughness, as determined from neutron reflectivity, is lower than the geometrical roughness, in conformity with the behavior of a number of magnetic thin films and multilayers. (C) 2004 Elsevier B.V. All rights reserved Y1 - 2004 ER - TY - JOUR A1 - Darowski, Nora A1 - Paschke, K. A1 - Pietsch, Ullrich A1 - Wang, K. H. A1 - Forchel, Alfred A1 - Lübbert, Daniel A1 - Baumbach, Tilo T1 - Structural characterization of a GaAs surface wire structure by triple-axis X-ray grazing incidence diffraction Y1 - 1998 ER - TY - JOUR A1 - Zhuang, Y. A1 - Schelling, Christoph A1 - Stangl, Jochen A1 - Penn, C. A1 - Senz, S. A1 - Schäffler, Friedrich A1 - Roche, T. A1 - Daniel, A. A1 - Grenzer, Jörg A1 - Pietsch, Ullrich A1 - Bauer, Günther T1 - Structural and optical properties of Si/Si{1-x}Ge{x} wires Y1 - 2000 ER - TY - JOUR A1 - Zhuang, Y. A1 - Holý, Václav A1 - Stangl, Jochen A1 - Darhuber, A. A1 - Mikulik, P. A1 - Zerlauth, S. A1 - Schäffler, F. A1 - Bauer, Günther A1 - Darowski, Nora A1 - Lübbert, Daniel A1 - Pietsch, Ullrich T1 - Strain relaxation in periodic arrays of Si/SiGe quantum wires determined by coplanar high-resolution x-ray diffrcation and grazing-incidence diffraction Y1 - 1999 ER - TY - JOUR A1 - Lübbert, Daniel A1 - Baumbach, Tilo A1 - Ponti, S. A1 - Pietsch, Ullrich A1 - Leprince, L. A1 - Schneck, J. A1 - Talneau, A. T1 - Strain investigation of low strained buried gratings by grazing incidence X-Ray diffraction and the theory of elasticity Y1 - 1999 ER - TY - JOUR A1 - Pietsch, Ullrich A1 - Zeimer, Ute A1 - Hofmann, L. A1 - Grenzer, Jörg A1 - Gramlich, S. T1 - Strain induced compositional modulations in AlGaAs overlayers induced by lateral surface gratings Y1 - 2001 SN - 0272-9172 ER - TY - JOUR A1 - Grenzer, Jörg A1 - Darowski, Nora A1 - Geue, Thomas A1 - Pietsch, Ullrich A1 - Daniel, A. A1 - Rennon, Siegfried A1 - Reithmaier, Johann-Peter A1 - Forchel, Alfred T1 - Strain analysis and quantum well intermixing of a laterally modulated multiquantum well system produced by focused ion beam implantation Y1 - 2001 ER - TY - JOUR A1 - Henneberg, Oliver A1 - Pietsch, Ullrich A1 - Panzner, Tobias A1 - Geue, Thomas A1 - Finkelstein, Kenneth D. T1 - Simultaneous X-ray and visible light diffraction for the investigation of surface relief and density grating formation in azobenzene containing polymer films N2 - The development of surface relief and density patterns in azobenzene polymer films was studied by diffraction at two different wavelengths. We used x-ray diffraction of synchrotron radiation at 0.124 nm in combination with visible light diffraction at a wavelength of 633 nm. In contrast to visible light scattering x-ray diffraction allows the separation of a surface relief and a density grating contribution due to the different functional dependence of the scattering power. Additionally, the x-ray probe is most sensitive for the onset of the surface grating formation Y1 - 2006 UR - http://www.informaworld.com/smpp/title~content=t713644168~db=all U6 - https://doi.org/10.1080/15421400500383345 SN - 1542-1406 ER - TY - JOUR A1 - Veldkamp, Markus A1 - Erko, Alexei A1 - Gudat, Wolfgang A1 - Abrosimov, Nikolai V. A1 - Alex, Volker A1 - Khasanov, Salavat A1 - Neissendorfer, Frank A1 - Pietsch, Ullrich A1 - Shekhtman, Veniamin T1 - Si(1-x)Ge(x) laterally graded crystals as monochromators for X-Ray absorption spectroscopy studies Y1 - 1999 ER - TY - JOUR A1 - Avilov, Anatoly S. A1 - Kulygin, Alexander K. A1 - Pietsch, Ullrich A1 - Spence, John C. H. A1 - Tsirelson, Vladimir G. A1 - Zuo, Ming J. T1 - Scanning system for high-energy electron diffractometry Y1 - 1999 UR - http://www3.interscience.wiley.com/journal/118518709/home?CRETRY=1&SRETRY=0 U6 - https://doi.org/10.1107/S0021889899006755 SN - 0021-8898 ER - TY - JOUR A1 - Pietsch, Ullrich A1 - Hazra, S. A1 - Chini, T. K. A1 - Sanyal, M. K. A1 - Grenzer, Jörg T1 - Ripple structure of crystalline layers in ion beam induced Si wafers N2 - Ion-beam-induced ripple formation in Si wafers was studied by two complementary surface sensitive techniques, namely atomic force microscopy (AFM) and depth-resolved x-ray grazing incidence diffraction (GID). The formation of ripple structure at high doses (similar to7x10(17) ions/cm(2)), starting from initiation at low doses (similar to1x10(17) ions/cm(2)) of ion beam, is evident from AFM, while that in the buried crystalline region below a partially crystalline top layer is evident from GID study. Such ripple structure of crystalline layers in a large area formed in the subsurface region of Si wafers is probed through a nondestructive technique. The GID technique reveals that these periodically modulated wavelike buried crystalline features become highly regular and strongly correlated as one increases the Ar ion-beam energy from 60 to 100 keV. The vertical density profile obtained from the analysis of a Vineyard profile shows that the density in the upper top part of ripples is decreased to about 15% of the crystalline density. The partially crystalline top layer at low dose transforms to a completely amorphous layer for high doses, and the top morphology was found to be conformal with the underlying crystalline ripple Y1 - 2004 ER - TY - JOUR A1 - Pietsch, Ullrich T1 - Reversible negative thermal expansion of polymer films Y1 - 2002 ER - TY - JOUR A1 - Tsirelson, Vladimir G. A1 - Avilov, Anatoly S. A1 - Lepeshov, G. G. A1 - Kuligin, A. K. A1 - Stahn, Jochen A1 - Pietsch, Ullrich A1 - Spence, J. C. H. T1 - Quantitative Analysis of the Inner-Crystal Electrostatic Potential of several Rock-Salt-Structure Crystals Using Accurate Electron-Diffraction Data Y1 - 2001 SN - 1089-5647 ER - TY - JOUR A1 - Geue, Thomas A1 - Stumpe, Joachim A1 - Pietsch, Ullrich A1 - Haak, M. A1 - Kaupp, G. T1 - Photochemically induced changes of optical anisotropy and surface of LB-multilayers built up by an amphiphilic and liquid crystalline copolymer conating azobenzene moieties Y1 - 1995 ER -