TY  - JOUR
A1  - Send, Sebastian
A1  - Abboud, Ali
A1  - Leitenberger, Wolfram
A1  - Weiss, Manfred S.
A1  - Hartmann, Robert
A1  - Strüder, Lothar
A1  - Pietsch, Ullrich
T1  - Analysis of polycrystallinity in hen egg-white lysozyme using a pnCCD
JF  - Journal of applied crystallography
N2  - A crystal of hen egg-white lysozyme was analyzed by means of energy-dispersive X-ray Laue diffraction with white synchrotron radiation at 2.7 angstrom resolution using a pnCCD detector. From Laue spots measured in a single exposure of the arbitrarily oriented crystal, the lattice constants of the tetragonal unit cell could be extracted with an accuracy of about 2.5%. Scanning across the sample surface, Laue images with split reflections were recorded at various positions. The corresponding diffraction patterns were generated by two crystalline domains with a tilt of about 1 degrees relative to each other. The obtained results demonstrate the potential of the pnCCD for fast X-ray screening of crystals of macromolecules or proteins prior to conventional X-ray structure analysis. The described experiment can be automatized to quantitatively characterize imperfect single crystals or polycrystals.
Y1  - 2012
U6  - https://doi.org/10.1107/S0021889812015038
SN  - 0021-8898
VL  - 45
IS  - 6
SP  - 517
EP  - 522
PB  - Wiley-Blackwell
CY  - Hoboken
ER  - 
TY  - JOUR
A1  - Abboud, Ali
A1  - Send, Sebastian
A1  - Pashniak, N.
A1  - Leitenberger, Wolfram
A1  - Ihle, Sebastian
A1  - Huth, M.
A1  - Hartmann, Robert
A1  - Strüder, Lothar
A1  - Pietsch, Ullrich
T1  - Sub-pixel resolution of a pnCCD for X-ray white beam applications
JF  - Journal of instrumentation
N2  - A new approach to achieve sub-pixel spatial resolution in a pnCCD detector with 75 x 75 mu m(2) pixel size is proposed for X-ray applications in single photon counting mode. The approach considers the energy dependence of the charge cloud created by a single photon and its split probabilities between neighboring pixels of the detector based on a rectangular model for the charge cloud density. For cases where the charge of this cloud becomes distributed over three or four pixels the center position of photon impact can be reconstructed with a precision better than 2 mu m. The predicted charge cloud sizes are tested at selected X-ray fluorescence lines emitting energies between 6.4 keV and 17.4 keV and forming charge clouds with size (rms) varying between 8 mu m and 10 mu m respectively. The 2 mu m enhanced spatial resolution of the pnCCD is verified by means of an x-ray transmission experiment throughout an optical grating.
KW  - Solid state detectors
KW  - Interaction of radiation with matter
KW  - Detector modelling and simulations II (electric fields, charge transport, multiplication and induction, pulse formation, electron emission, etc)
Y1  - 2013
U6  - https://doi.org/10.1088/1748-0221/8/05/P05005
SN  - 1748-0221
VL  - 8
IS  - 3
PB  - IOP Publ. Ltd.
CY  - Bristol
ER  - 
TY  - JOUR
A1  - Send, Sebastian
A1  - Abboud, Ali
A1  - Hartmann, Robert
A1  - Huth, M.
A1  - Leitenberger, Wolfram
A1  - Pashniak, N.
A1  - Schmidt, J.
A1  - Strüder, Lothar
A1  - Pietsch, Ullrich
T1  - Characterization of a pnCCD for applications with synchrotron radiation
JF  - Nuclear instruments & methods in physics research : a journal on accelerators, instrumentation and techniques applied to research in nuclear and atomic physics, materials science and related fields in physics ; A, Accelerators, spectrometers, detectors and associated equipment
N2  - In this work we study the response of a pnCCD by means of X-ray spectroscopy in the energy range between 6 key and 20 key and by Laue diffraction techniques. The analyses include measurements of characteristic detector parameters like energy resolution, count rate capability and effects of different gain settings. The limit of a single photon counting operation in white beam X-ray diffraction experiments is discussed with regard to the occurrence of pile-up events, for which the energy information about individual photons is lost. In case of monochromatic illumination the pnCCD can be used as a fast conventional CCD with a charge handling capacity (CHC) of about 300,000 electrons per pixel. If the CHC is exceeded, any surplus charge will spill to neighboring pixels perpendicular to the transfer direction due to electrostatic repulsion. The possibilities of increasing the number of storable electrons are investigated for different voltage settings by exposing a single pixel with X-rays generated by a microfocus X-ray source. The pixel binning mode is tested as an alternative approach that enables a pnCCD operation with significantly shorter readout times.
KW  - pnCCD
KW  - X-ray spectroscopy
KW  - X-ray imaging
KW  - Energy-dispersive Laue diffraction
Y1  - 2013
U6  - https://doi.org/10.1016/j.nima.2013.01.044
SN  - 0168-9002
VL  - 711
IS  - 5
SP  - 132
EP  - 142
PB  - Elsevier
CY  - Amsterdam
ER  - 
TY  - JOUR
A1  - Zen, Achmad
A1  - Saphiannikova, Marina
A1  - Neher, Dieter
A1  - Grenzer, Jörg
A1  - Grigorian, Souren A.
A1  - Pietsch, Ullrich
A1  - Asawapirom, Udom
A1  - Janietz, Silvia
A1  - Scherf, Ullrich
A1  - Lieberwirth, Ingo
A1  - Wegner, Gerhard
T1  - Effect of molecular weight on the structure and crystallinity of poly(3-hexylthiophene)
N2  - Recently, two different groups have reported independently that the mobility of field-effect transistors made from regioregular poly(3-hexylthiophene) (P3HT) increases strongly with molecular weight. Two different models were presented: one proposing carrier trapping at grain boundaries and the second putting emphasis on the conformation and packing of the polymer chains in the thin layers for different molecular weights. Here, we present the results of detailed investigations of powders and thin films of deuterated P3HT fractions with different molecular weight. For powder samples, gel permeation chromatography (GPC), differential scanning calorimetry (DSC), and X-ray diffraction (XRD) were used to investigate the structure and crystallization behavior of the polymers. The GPC investigations show that all weight fractions possess a rather broad molecular weight distribution. DSC measurements reveal a strong decrease of the crystallization temperature and, most important, a significant decrease of the degree of crystallinity with decreasing molecular weight. To study the structure of thin layers in lateral and vertical directions, both transmission electron microscopy (TEM) and X-ray grazing incidence diffraction (GID) were utilized. These methods show that thin layers of the low molecular weight fraction consist of well-defined crystalline domains embedded in a disordered matrix. We propose that the transport properties of layers prepared from fractions of poly(3-hexylthiophene) with different molecular weight are largely determined by the crystallinity of the samples and not by the perfection of the packing of the chains in the individual crystallites
Y1  - 2006
UR  - http://pubs.acs.org/doi/full/10.1021/ma0521349
U6  - https://doi.org/10.1021/Ma0521349
ER  - 
TY  - JOUR
A1  - Panzner, Tobias
A1  - Gleber, Gudrun
A1  - Sant, Tushar
A1  - Leitenberger, Wolfram
A1  - Pietsch, Ullrich
T1  - Coherence experiments at the white-beam beamline of BESSYI
N2  - The third-generation X-ray source BESSYII (Berlin, Germany) provides coherent X-ray radiation which can be used for static and dynamic speckle analysis. Recently we have demonstrated that one can perform experiments with coherent white radiation provided by a bending magnet (5 < E < 20 keV). In this paper we show that the diffraction figure of the initial pinhole must be considered for the interpretation of coherent experiments. The reflectivity spectrum of a sample results from the Fresnel diffraction of the incident pinhole deformed by the static speckle features of the sample surface. For dynamical experiments all speckle like features alter with time whereas the pure Fresnel fringes remain constant. (c) 2007 Published by Elsevier B.V.
Y1  - 2007
UR  - http://www.sciencedirect.com/science?_ob=MImg&_imagekey=B6TW0-4N08M4P-1- F&_cdi=5548&_user=1584062&_orig=search&_coverDate=05%2F23%2F2007&_sk=994849985&view=c&wchp=dGLbVzW- zSkWA&md5=3a09375f874dccd9b382488e9d0
U6  - https://doi.org/10.1016/j.tsf.2006.12.002
ER  - 
TY  - JOUR
A1  - Leitenberger, Wolfram
A1  - Hartmann, Robert
A1  - Pietsch, Ullrich
A1  - Andritschke, Robert
A1  - Starke, Ines
A1  - Strüder, Lothar
T1  - Application of a pnCCD in X-ray diffraction : a three-dimensional X-ray detector
N2  - The first application of a pnCCD detector for X-ray scattering experiments using white synchrotron radiation at BESSY II is presented. A Cd arachidate multilayer was investigated in reflection geometry within the energy range 7 keV < E < 35 keV. At fixed angle of incidence the two-dimensional diffraction pattern containing several multilayer Bragg peaks and respective diffuse-resonant Bragg sheets were observed. Since every pixel of the detector is able to determine the energy of every incoming photon with a resolution Delta E/E similar or equal to 10(-2). a three-dimensional dataset is finally obtained. In order to achieve this energy resolution the detector was operated in the so-called single-photon- counting mode. A full dataset was evaluated taking into account all photons recorded within 10(5) detector frames at a readout rate of 200 Hz. By representing the data in reciprocal-space coordinates, it becomes obvious that this experiment with the pnCCD detector provides the same information as that obtained by combining a large number of monochromatic scattering experiments using conventional area detectors.
Y1  - 2008
UR  - http://onlinelibrary.wiley.com/iucr/10.1107/S0909049508018931
U6  - https://doi.org/10.1107/S0909049508018931
ER  - 
TY  - JOUR
A1  - Reinhold, Beate
A1  - Geue, Thomas
A1  - Huber, Patrick
A1  - Sant, Tushar
A1  - Pietsch, Ullrich
A1  - Sztucki, Michael
T1  - In situ and ex situ SAXS investigation of colloidal sedimentation onto laterally patterned support
N2  - We report on in situ investigations of colloidal ordering during gravity sedimentation from a colloidal suspension onto a prepatterned support using a polymeric surface relief grating (SRG) as the support. The ordering of colloids with a diameter of 420 nm was investigated by means of grazing-incidence small-angle X-ray scattering (GISAXS) and transmission SAXS using a preparation cell guaranteeing stable temperature and humidity. GISAXS was used for in situ monitoring of the time evolution of colloidal ordering within the whole illuminated sample area. The onset of ordering was indicated by the increase of integrated intensity within a small time frame shortly before complete evaporation of the dispersant. Single domains of coated samples were investigated ex situ by SAXS in transmission geometry where the irradiated sample area was 200 x 200 mu m(2) only. Domains with the typical size of a few millimeters were observed varying in orientation and crystallographic structure for various positions at the sample. They were mainly oriented along the grooves of the grating, confirming the influence of the underlying grating on colloidal ordering.
Y1  - 2009
UR  - http://pubs.acs.org/journal/langd5
U6  - https://doi.org/10.1021/La803078b
SN  - 0743-7463
ER  - 
TY  - JOUR
A1  - Reddy, Raghavendra V.
A1  - Gupta, Ajay
A1  - Gome, Anil
A1  - Leitenberger, Wolfram
A1  - Pietsch, Ullrich
T1  - In situ x-ray reflectivity and grazing incidence x-ray diffraction study of L1(0) ordering in Fe-57/Pt multilayers
N2  - In situ high temperature x-ray reflectivity and grazing incidence x-ray diffraction measurements in the energy dispersive mode are used to study the ordered face-centered tetragonal (fct) L1(0) phase formation in [Fe(19 angstrom)/ Pt(25 angstrom)](x10) multilayers prepared by ion beam sputtering. With the in situ x-ray measurements it is observed that (i) the multilayer structure first transforms to a disordered FePt and subsequently to an ordered fct L1(0) phase, (ii) the ordered fct L1(0) FePt peaks start to appear at 320°C annealing, (iii) the activation energy of the interdiffusion is 0.8 eV and (iv) ordered fct FePt grains have preferential out-of-plane texture. The magneto-optical Kerr effect and conversion electron Mossbauer spectroscopies are used to study the magnetic properties of the as- deposited and 400°C annealed multilayers. The magnetic data for the 400°C annealed sample indicate that the magnetization is at an angle of ~50° from the plane of the film.
Y1  - 2009
UR  - http://iopscience.iop.org/0953-8984
U6  - https://doi.org/10.1088/0953-8984/21/18/186002
SN  - 0953-8984
ER  - 
TY  - JOUR
A1  - Joshi, Siddharth
A1  - Pingel, Patrick
A1  - Grigorian, Souren
A1  - Panzner, Tobias
A1  - Pietsch, Ullrich
A1  - Neher, Dieter
A1  - Forster, Michael
A1  - Scherf, Ullrich
T1  - Bimodal temperature behavior of structure and mobility in high molecular weight p3ht thin films
N2  - We report a temperature dependent crystalline structure of spin-coated thin films of high molecular weight regioregular poly(3-hexylthiophene) (P3HT) (M-n similar to 30000 g/mol) and its correlation with charge carrier mobility. These investigations show a reversible change of the crystalline structure, where the interlayer lattice spacing (100)along the alkyl side chains continuously increases up to a temperature of about 220 degrees C; in contrast, the in-plane pi-pi distance reduces with increasing temperature. These changes in structure are reversible and can be repeated several times. The temperature-induced structural properties differ for thick and thin films, pointing to a surface/interface role in stabilization of the layer morphology. In contrast to the structural changes, the carrier mobility is rather constant in the temperature range from room temperature up to 100-120 degrees C, followed by a continuous decrease. For thick layers this drop is significant and the transistor performance almost vanishes at high temperature, however, it completely recovers upon cooling back to roorn temperature. The drop of the charge carrier mobility at higher temperatures is in contrast with expectations front the structural studies, considering the increase of crystalline fraction of the polycrystalline layer. our electrical measurements Underscore that the reduction of the macroscopic mobility is mostly caused by it pronounced decrease of the intergrain transport. The thermally induced crystallization along(100) direction and the creation of numerous small crystallites at the film-substrate interface reduce the number of long polymer chain, bridging crystalline domains, which ultimately limits the macroscopic charge transport.
Y1  - 2009
UR  - http://pubs.acs.org/journal/mamobx
U6  - https://doi.org/10.1021/Ma900021w
SN  - 0024-9297
ER  - 
TY  - JOUR
A1  - Henneberg, Oliver
A1  - Pietsch, Ullrich
A1  - Panzner, Tobias
A1  - Geue, Thomas
A1  - Finkelstein, Kenneth D.
T1  - Simultaneous X-ray and visible light diffraction for the investigation of surface relief and density grating formation in azobenzene containing polymer films
N2  - The development of surface relief and density patterns in azobenzene polymer films was studied by diffraction at two different wavelengths. We used x-ray diffraction of synchrotron radiation at 0.124 nm in combination with visible light diffraction at a wavelength of 633 nm. In contrast to visible light scattering x-ray diffraction allows the separation of a surface relief and a density grating contribution due to the different functional dependence of the scattering power. Additionally, the x-ray probe is most sensitive for the onset of the surface grating formation
Y1  - 2006
UR  - http://www.informaworld.com/smpp/title~content=t713644168~db=all
U6  - https://doi.org/10.1080/15421400500383345
SN  - 1542-1406
ER  - 
TY  - JOUR
A1  - Avilov, Anatoly S.
A1  - Kulygin, Alexander K.
A1  - Pietsch, Ullrich
A1  - Spence, John C. H.
A1  - Tsirelson, Vladimir G.
A1  - Zuo, Ming J.
T1  - Scanning system for high-energy electron diffractometry
Y1  - 1999
UR  - http://www3.interscience.wiley.com/journal/118518709/home?CRETRY=1&SRETRY=0
U6  - https://doi.org/10.1107/S0021889899006755
SN  - 0021-8898
ER  - 
TY  - JOUR
A1  - Send, Sebastian
A1  - von Kozierowski, Marc
A1  - Panzner, Tobias
A1  - Gorfman, Semen
A1  - Nurdan, Kivanc
A1  - Walenta, Albert H.
A1  - Pietsch, Ullrich
A1  - Leitenberger, Wolfram
A1  - Hartmann, Robert
A1  - Strüder, Lothar
T1  - Energy-dispersive Laue diffraction by means of a frame-store pnCCD
Y1  - 2009
UR  - http://journals.iucr.org/j/journalhomepage.html
U6  - https://doi.org/10.1107/S0021889809039867
SN  - 0021-8898
ER  - 
TY  - JOUR
A1  - Brajpuriya, Ranjeet
A1  - Tripathi, Sumit
A1  - Sharma, Abhishek
A1  - Chaudhari, S.M.
A1  - Phase, D.M.
A1  - Gupta, Ajay
A1  - Shripathi, Thoudinja
A1  - Leitenberger, Wolfram
A1  - Pietsch, Ullrich
A1  - Laxmi, N.
T1  - Temperature dependent energy-dispersive X-ray diffraction and magnetic study of Fe/Al interface
N2  - In situ temperature dependent energy-dispersive structural and magnetic study of electron beam evaporated Fe/Al multilayer sample (MLS) has been investigated. The structural studies show the formation of an intermixed FeAl transition layer of a few nanometers thick at the interface during deposition, which on annealing at 300 degrees C transforms to B2FeAl intermetallic phase. Magnetization decreases with increase in temperature and drops to minimum above 300 degrees C due to increase in anti-ferromagnetic interlayer coupling and formation of nonmagnetic FeAl phase at the interface. The Curie temperature (T-c) is found to be 288 degrees C and is much less than that of bulk bcc Fe.
Y1  - 2007
UR  - http://www.sciencedirect.com/science/journal/01694332
U6  - https://doi.org/10.1016/j.apsusc.2007.04.069
SN  - 0169-4332
ER  - 
TY  - JOUR
A1  - Reiche, Jürgen
A1  - Pietsch, Ullrich
A1  - Fink, Hans-Peter
A1  - Lemmetyinen, Helge
T1  - A comparison fo x-ray methods for structure refinement of Langmuir-Blodgett multilayers
N2  - The possibilities and limits of structure refinement of Langmuir-Blodgett films by means of symmetrical reflection of X- rays are described using the example of a stearic acid multilayer. Three different techniques for the determiantion of the electron density profile from reflectivity data are compared; a Fourier method, a Patterson method, and model calculations. The important role of the a priori information for finding the besft structure model is outlined.
Y1  - 1992
ER  - 
TY  - JOUR
A1  - Reiche, Jürgen
A1  - Barberka, Thomas Andreas
A1  - Knochenhauer, Gerald
A1  - Woolley, Martin
A1  - Pietsch, Ullrich
T1  - Comprehensive structure investigation and computer modelling of perfluorododecanoic acid multilayers formed by in-vacuo thermal evaporation
Y1  - 1994
ER  - 
TY  - JOUR
A1  - Reiche, Jürgen
A1  - Barberka, Thomas Andreas
A1  - Janietz, Dietmar
A1  - Hofmann, Dieter
A1  - Pietsch, Ullrich
A1  - Brehmer, Ludwig
T1  - X-ray structure investigation and computer modelling of Langmuir-Blodgett films formed from disc-shaped pentaalkines
Y1  - 1994
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Holý, Vaclav
A1  - Strömmer, R.
A1  - Englisch, Uwe
T1  - X-ray and neutron diffuse scattering from multilayers of fatty acid salt molecules
Y1  - 1995
ER  - 
TY  - JOUR
A1  - Reiche, Jürgen
A1  - Knochenhauer, Gerald
A1  - Barberka, Thomas Andreas
A1  - Geue, Thomas
A1  - Pietsch, Ullrich
A1  - Brehmer, Ludwig
A1  - Hodge, P.
A1  - Tredgold, Richard H.
T1  - In-plane structure of perfluorotetra decanoic acid Langmuir-Blodgett films and films formed by vacuum deposition
Y1  - 1995
ER  - 
TY  - JOUR
A1  - Reiche, Jürgen
A1  - Dietzel, Birgit
A1  - Freydank, Anke-Christine
A1  - Geue, Thomas
A1  - Pietsch, Ullrich
A1  - Brehmer, Ludwig
T1  - Lateral structure of thermally treated oxadiazole Langmuir-Blodgett films
Y1  - 1995
ER  - 
TY  - JOUR
A1  - Geue, Thomas
A1  - Stumpe, Joachim
A1  - Pietsch, Ullrich
A1  - Haak, M.
A1  - Kaupp, G.
T1  - Photochemically induced changes of optical anisotropy and surface of LB-multilayers built up by an amphiphilic and liquid crystalline copolymer conating azobenzene moieties
Y1  - 1995
ER  - 
TY  - JOUR
A1  - Englisch, Uwe
A1  - Barberka, Thomas Andreas
A1  - Pietsch, Ullrich
A1  - Höhne, U.
T1  - Investigation of the chain-chain interface in a lead-stearate multilayer using neutron reflectivity
Y1  - 1995
ER  - 
TY  - JOUR
A1  - Reiche, Jürgen
A1  - Penacorada, Florencio
A1  - Geue, Thomas
A1  - Pietsch, Ullrich
A1  - Brehmer, Ludwig
T1  - In-plane structure of uranylarachidate multilayers
Y1  - 1995
ER  - 
TY  - JOUR
A1  - Stahn, Jochen
A1  - Möhle, Marcus
A1  - Pietsch, Ullrich
T1  - Accurate structure determination for GaAs using Pendellösung oscillation
Y1  - 1996
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Hansen, N. K.
T1  - A critical review of the valence charge density in GaAs
Y1  - 1996
ER  - 
TY  - JOUR
A1  - Lichanot, Albert
A1  - Azavant, P.
A1  - Pietsch, Ullrich
T1  - Ab-initio Hartree-Fock study of the electronic charge density of the cubic boron nitride and its comparison with the experiment
Y1  - 1996
ER  - 
TY  - JOUR
A1  - Reiche, Jürgen
A1  - Knochenhauer, Gerald
A1  - Dietel, Reinhard
A1  - Freydank, Anke-Christine
A1  - Zetzsche, Thomas
A1  - Pietsch, Ullrich
A1  - Brehmer, Ludwig
A1  - Barberka, Thomas Andreas
A1  - Geue, Thomas
T1  - Structure of thermally treated oxadiazoleamide Langmuir-Blodgett films
N2  - The thermal treatment of Y-type Langmuir-Blodgett (LB) films formed from the amphiphilic derivative of 2,5- diphenyl-1,3,4-oxadiazole 1 results in changes of the molecular packing. These changes have been analysed by a combination of X-ray specular reflectivity data, X-ray grazing incidence diffraction data and scanning force microscopy images, On the basis of these experimental data we have simulated possible supramolecular structures, These simulations provide insight into the intermolecular interactions giving rise to the observed structural transitions. The crystalline structure induced by thermal treatment of the LB films is characterized by a uniaxial texture, which is correlated with the dipping direction during deposition of the LB film.
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Reiche, Jürgen
A1  - Penacorada, Florencio
A1  - Geue, Thomas
A1  - Pietsch, Ullrich
A1  - Brehmer, Ludwig
T1  - Monolayers and multilayers of uranyl arachidate : in-plane structure of uranyl arachidate multilayers
N2  - The molecular in-plane structure of uranyl arachidate Langmuir-Blodgett (LB) films formed at different subphase pH values was analysed by means of X-ray grazing-incidence diffraction. For multilayers formed at low subphase pH a reorganisation of the arachidic acid film structure is confirmed. At appropriate subphase pH values, reorganisation of the film structure, e.g. via the formation of three-dimensional crystallites, is prevented by the presence of the uranyl ions and by the subsequent introduction of conformational disorder (gauche defects) in the alkyl chains. The observation of a macroscopic flow-induced in-plane texture in these uranyl arachidate LB films has profound implications for the design of ordered, supramolecular structures by the Langmuir-Blodgett technique.
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Barberka, Thomas Andreas
A1  - Geue, Thomas
A1  - Stömmer, Ralph
T1  - X-ray scattering from thin organic films and multilayers
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Englisch, Uwe
A1  - Gutberlet, T.
A1  - Seitz, R.
A1  - Oeser, R.
A1  - Pietsch, Ullrich
T1  - Thermally induced rearrangement of fatty acid salt molecules in Langmuir-Blodgett multilayers
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Darowski, Nora
A1  - Paschke, K.
A1  - Pietsch, Ullrich
A1  - Wang, K. H.
A1  - Forchel, Alfred
A1  - Baumbach, Tilo
A1  - Zeimer, Ute
T1  - Identification of a buried single quantum well within surface structurized semiconductors using depth resolved x-ray grazing-incidence diffraction
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Rose, Dirk
A1  - Pietsch, Ullrich
A1  - Zeimer, Ute
T1  - Characterization of InGaAs single quantum wells buried in GaAs[001] by grazing incidence diffraction
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Bolm, A.
A1  - Englisch, Uwe
A1  - Penacorada, Florencio
A1  - Gerstenberger, M.
A1  - Pietsch, Ullrich
T1  - Temperature and time dependent investigations of cd- and uranyl-stearate multilayers by means of neutron reflectivity measurements
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Herrmann, A.
A1  - Kaupp, G.
A1  - Geue, Thomas
A1  - Pietsch, Ullrich
T1  - AFM and GID investigations of the gas-solid diazotation of 4-sulfanil-acid-monohydrat single crystals
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Paschke, K.
A1  - Geue, Thomas
A1  - Barberka, Thomas Andreas
A1  - Bolm, A.
A1  - Pietsch, Ullrich
A1  - Rösch, M.
A1  - Batke, Edwin
A1  - Faller, F.
A1  - Kerkel, K.
A1  - Oshiniwo, J.
A1  - Forchel, Alfred
T1  - Characterization of lateral semiconductor nano structures by means of x-ray grazing-incidence diffraction
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Siebrecht, R.
A1  - Schreyer, A.
A1  - Englisch, Uwe
A1  - Pietsch, Ullrich
A1  - Zabel, Hartmut
T1  - The new reflectometer ADAM at the ILL
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Neißendorfer, Frank
A1  - Bolm, A.
A1  - Pietsch, Ullrich
T1  - Energy dispersive X-ray reflectometry and X-ray grazing incidence diffraction from organic multilayers
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Darowski, Nora
A1  - Pietsch, Ullrich
A1  - Wang, K. H.
A1  - Forchel, Alfred
A1  - Shen, W.
A1  - Kycia, S.
T1  - X-ray diffraction analysis of strain relaxation in free standing and buried GaAs/GaInAs/GaAs SQW lateral structures
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Haier, P.
A1  - Herrmann, B. A.
A1  - Esser, N.
A1  - Pietsch, Ullrich
A1  - Lüders, K.
A1  - Richter, W.
T1  - Influence of the deposition rate on the structure of thin metal layers
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Stahn, Jochen
A1  - Pucher, Andreas
A1  - Geue, Thomas
A1  - Daniel, A.
A1  - Pietsch, Ullrich
T1  - Electric field induced electron density response of GaAs and ZnSe
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Darowski, Nora
A1  - Lübbert, Daniel
A1  - Pietsch, Ullrich
A1  - Zhuang, Y.
A1  - Zerlauth, S.
A1  - Bauer, Günther
T1  - In-plane strain and strain relaxation in laterally patterned Si/SiGe quantum dots and wire arrays
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Stömmer, Ralph
A1  - Göbel, H.
A1  - Hub, W.
A1  - Pietsch, Ullrich
T1  - X-ray scattering from silicon surfaces
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Stömmer, Ralph
A1  - Martin, C. R.
A1  - Geue, Thomas
A1  - Göbel, H.
A1  - Hub, W.
A1  - Pietsch, Ullrich
T1  - Comparative studies of fractal parameters of Si(100) surfaces measured by X-ray scattering and atomic force microscopy
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Darowski, Nora
A1  - Pietsch, Ullrich
A1  - Zeimer, Ute
A1  - Smirnitzki, V.
A1  - Bugge, F.
T1  - Nondestructive analysis of a lateral GaAs nanostructure buried under AlGaAs using conventional high resolution and grazing incidence X-ray diffraction
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Darowski, Nora
A1  - Paschke, K.
A1  - Pietsch, Ullrich
A1  - Wang, K. H.
A1  - Forchel, Alfred
A1  - Lübbert, Daniel
A1  - Baumbach, Tilo
T1  - Structural characterization of a GaAs surface wire structure by triple-axis X-ray grazing incidence diffraction
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Ulyanenkov, A.
A1  - Klemradt, U.
A1  - Pietsch, Ullrich
T1  - Investigation of strain relaxation in GaInAs/GaAs superlattices by x-ray diffuse scattering
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Grenzer, Jörg
A1  - Schomburg, E.
A1  - Lingott, I.
A1  - Ignotov, A. a.
A1  - Renk, K. F.
A1  - Pietsch, Ullrich
A1  - Rose, Dirk
A1  - Zeimer, Ute
A1  - Melzer, B. J.
A1  - Ivanov, S.
A1  - Schaposchnikov, S.
A1  - Kop'ev, P. S.
A1  - Pavel'ev, D. G.
A1  - Koschurinov, Yu.
T1  - X-ray and transport characterization of an Esaki-Tsu superlattice device
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Stahn, Jochen
A1  - Möhle, Marcus
A1  - Pietsch, Ullrich
T1  - Comparison of theoretical and experimental structure amplitudes of GaAs
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Tsirelson, Vladimir G.
A1  - Abramov, Yury Fedorovich
A1  - Zavodnik, Valerie E.
A1  - Stash, Adam I.
A1  - Belokoneva, Elena L.
A1  - Stahn, Jochen
A1  - Pietsch, Ullrich
A1  - Feil, Dirk
T1  - Critical pionts in a crystal an procrystal
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Englisch, Uwe
A1  - Penacorada, Florencio
A1  - Samoilenko, I.
A1  - Pietsch, Ullrich
T1  - Investigation of the vertical molecular exchange in a complex organic multilayer system
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Zhuang, Y.
A1  - Holý, Václav
A1  - Stangl, Jochen
A1  - Darhuber, A.
A1  - Mikulik, P.
A1  - Zerlauth, S.
A1  - Schäffler, F.
A1  - Bauer, Günther
A1  - Darowski, Nora
A1  - Lübbert, Daniel
A1  - Pietsch, Ullrich
T1  - Strain relaxation in periodic arrays of Si/SiGe quantum wires determined by coplanar high-resolution x-ray diffrcation and grazing-incidence diffraction
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Zeimer, Ute
A1  - Baumbach, Tilo
A1  - Grenzer, Jörg
A1  - Lübbert, Daniel
A1  - Mazuelas, A.
A1  - Pietsch, Ullrich
A1  - Erbert, G.
T1  - In-situ characterization of strain distribution in broad-area high-power lasers under operation by high- resolution x-ray diffrcation and topography using synchrotron radiation
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Englisch, Uwe
A1  - Katholy, Stefan
A1  - Penacorada, Florencio
A1  - Reiche, Jürgen
A1  - Pietsch, Ullrich
T1  - Investigation of molecular diffusion across organic multilayers using neutron specular reflectivity
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Ulyanenkov, A.
A1  - Darowski, Nora
A1  - Grenzer, Jörg
A1  - Pietsch, Ullrich
A1  - Wang, K. H.
A1  - Forchel, Alfred
T1  - Evaluation of strain distribution in freestanding and bruied lateral nanostructures
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Stahn, Jochen
A1  - Pucher, Andreas
A1  - Pietsch, Ullrich
A1  - Zellner, J.
A1  - Weckert, E.
T1  - Experimental determination of electric field induced differences in structure factor phases in the order of 2%
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Veldkamp, Markus
A1  - Erko, Alexei
A1  - Gudat, Wolfgang
A1  - Abrosimov, Nikolai V.
A1  - Alex, Volker
A1  - Khasanov, Salavat
A1  - Neissendorfer, Frank
A1  - Pietsch, Ullrich
A1  - Shekhtman, Veniamin
T1  - Si(1-x)Ge(x) laterally graded crystals as monochromators for X-Ray absorption spectroscopy studies
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Ulyanenkov, A.
A1  - Baumbach, Tilo
A1  - Darowski, Nora
A1  - Pietsch, Ullrich
A1  - Wang, K. H.
A1  - Forchel, Alfred
A1  - Wiebach, T.
T1  - Investigation of the in-plane strain distribution in free-standing GaAs/InGaAs/GaAs single quantum well surface nanostructures on GaAs[001]
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Holý, Václav
A1  - Darhuber, A.
A1  - Stangl, Jochen
A1  - Zerlauth, S.
A1  - Schäffler, F.
A1  - Bauer, Günther
A1  - Darowski, Nora
A1  - Lübbert, Daniel
A1  - Pietsch, Ullrich
A1  - Vavra, I.
T1  - HRXRD and GID investigations of a self-organized SiGe quantum dot multilayer
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Neißendorfer, Frank
A1  - Pietsch, Ullrich
A1  - Breszisinski, G.
A1  - Möhwald, Helmuth
T1  - Energy-dispersive reflectometry and diffractometry at the WLS of BESSY-I
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Lübbert, Daniel
A1  - Baumbach, Tilo
A1  - Ponti, S.
A1  - Pietsch, Ullrich
A1  - Leprince, L.
A1  - Schneck, J.
A1  - Talneau, A.
T1  - Strain investigation of low strained buried gratings by grazing incidence X-Ray diffraction and the theory of elasticity
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Geue, Thomas
A1  - Schultz, M.
A1  - Englisch, Uwe
A1  - Stömmer, Ralph
A1  - Pietsch, Ullrich
A1  - Meine, Kerstin
A1  - Vollhard, D.
T1  - Investigation of pH-dependent domain structure of fatty acid salt Langmuir-Blodgett films by means of X-ray diffuse scattering and Atomic Force Microscopy
Y1  - 1999
ER  - 
TY  - BOOK
A1  - Holý, Václav
A1  - Pietsch, Ullrich
A1  - Baumbach, Tilo
T1  - High-resolution x-ray scattering from thin films and multilayers
T3  - Springer tracts in modern physics
Y1  - 1999
SN  - 3-540-62029-X
U6  - https://doi.org/10.1007/BFb0109385
VL  - 149
PB  - Springer
CY  - Berlin, Heidelberg
ER  - 
TY  - JOUR
A1  - Metzger, T. H.
A1  - Pietsch, Ullrich
A1  - Garstein, E.
T1  - High-resolution lattice parameter measurement by x-ray grazing incidence diffraction: Application to the interface of silicon on sapphire
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Englisch, Uwe
A1  - Penacorada, Florencio
A1  - Brehmer, Ludwig
A1  - Pietsch, Ullrich
T1  - X-ray and neutron reflection analysis of the structure and the molecular exchange process in simple and complex fatty acid salt Langmuir-Blodgett multilayers
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Holý, Václav
A1  - Stangl, Jochen
A1  - Zerlauth, S.
A1  - Bauer, Günther
A1  - Darowski, Nora
A1  - Lübbert, Daniel
A1  - Pietsch, Ullrich
T1  - Lateral arrangement of self-assembled quantum dots in an SiGe/Si superlattice
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Struth, Bernd
A1  - Decher, Gero
A1  - Schmitt, J.
A1  - Hofmeister, Wolfgang
A1  - Neißendorfer, Frank
A1  - Pietsch, Ullrich
A1  - Brezesinski, Gerald
A1  - Möhwald, Helmuth
T1  - Chemical modification of Topaz surfaces
Y1  - 1999
SN  - 0928-4931
ER  - 
TY  - JOUR
A1  - Geue, Thomas
A1  - Pietsch, Ullrich
A1  - Haferkorn, J.
A1  - Stumpe, Joachim
A1  - Date, R. W.
A1  - Fawcett, A. H.
T1  - Competition of alignment and aggregation? : Phenomena in constrained films of LC poly(olefin ulfone)s and maleic anhydride co- and terpolymers
Y1  - 1999
ER  - 
TY  - JOUR
A1  - Zeimer, Ute
A1  - Bugge, F.
A1  - Gramlich, S.
A1  - Smirnitzki, V.
A1  - Weyers, Markus
A1  - Tränkle, G.
A1  - Grenzer, Jörg
A1  - Pietsch, Ullrich
A1  - Cassabois, G.
A1  - Emiliani, V.
A1  - Lienau, C.
T1  - Evidence for strain-induced lateral carrier confinement in InGaAs quantum wells by low-temperature near-field spectroscopy
Y1  - 2000
ER  - 
TY  - JOUR
A1  - Mukherjee, M.
A1  - Bhattacharya, M. K.
A1  - Sanyal, M. K.
A1  - Geue, Thomas
A1  - Grenzer, Jörg
A1  - Pietsch, Ullrich
T1  - Temperature dependent thickness and surface tension of polymer films
Y1  - 2000
SN  - 81-7371295-6
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
T1  - Investigations of semiconductor surfaces and interfaces by X-ray grazing incidence diffraction
Y1  - 2000
SN  - 0011-3891
ER  - 
TY  - JOUR
A1  - Zhuang, Y.
A1  - Pietsch, Ullrich
A1  - Stangl, Jochen
A1  - Holý, Vaclav
A1  - Darowski, Nora
A1  - Grenzer, Jörg
A1  - Zerlauth, S.
A1  - Schäffler, F.
A1  - Bauer, Günther
T1  - In-plane strain and shape analysis of Si/SiGe nanostructures by grazing incidence diffraction
Y1  - 2000
ER  - 
TY  - JOUR
A1  - Zhuang, Y.
A1  - Schelling, Christoph
A1  - Stangl, Jochen
A1  - Penn, C.
A1  - Senz, S.
A1  - Schäffler, Friedrich
A1  - Roche, T.
A1  - Daniel, A.
A1  - Grenzer, Jörg
A1  - Pietsch, Ullrich
A1  - Bauer, Günther
T1  - Structural and optical properties of Si/Si{1-x}Ge{x} wires
Y1  - 2000
ER  - 
TY  - JOUR
A1  - Grenzer, Jörg
A1  - Darowski, Nora
A1  - Pietsch, Ullrich
A1  - Daniel, A.
A1  - Reithmaier, Johann-Peter
A1  - Rennon, Siegfried
A1  - Forchel, Alfred
T1  - Grazing-incidence diffraction strain analysis of a laterally-modulated multiquantum well system produced by focused-ion-beam implantation
Y1  - 2000
ER  - 
TY  - JOUR
A1  - Karcenko, Anatolij V.
A1  - Englisch, Uwe
A1  - Grenzer, Jörg
A1  - Geue, Thomas
A1  - Pietsch, Ullrich
A1  - Siebrecht, R.
T1  - Investigation of partially deuterated multilayers by means of X-ray and polarized neutron reflectometry
Y1  - 2000
SN  - 1044-8632
ER  - 
TY  - JOUR
A1  - Thünemann, Andreas F.
A1  - Kubowicz, Stephan
A1  - Pietsch, Ullrich
T1  - Ultra-thin solid polyelectrolyte-surfactant complex films : structure and wetting
Y1  - 2000
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Rochon, Paul
A1  - Natansohn, Almeria
T1  - Formation of a buried lateral density grating in azopenzene polymer films
Y1  - 2000
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Darowski, Nora
A1  - Ulyanenkov, A.
A1  - Grenzer, Jörg
A1  - Wang, K. H.
A1  - Forchel, Alfred
T1  - Analysis of the strain distribution in lateral nanostructures for interpreting photoluminescence data
Y1  - 2000
ER  - 
TY  - JOUR
A1  - Stahn, Jochen
A1  - Geue, Thomas
A1  - Grenzer, Jörg
A1  - Pietsch, Ullrich
T1  - Interaction of short-chain alkanes with surface and interfaces of multilayer films built from amphiphilic molecules: an in-situ X-ray and neutron scattering probe
Y1  - 2000
ER  - 
TY  - JOUR
A1  - Neumann, Werner
A1  - Buchsteiner, Alexandra
A1  - Mahler, Willy
A1  - Geue, Thomas
A1  - Pietsch, Ullrich
T1  - Dielectric loss spectroscopy at fatty acid salt multilayers
N2  - Dielectric loss spectroscopy (DLS) was performed at compact samples and lamellary organized Langmuir-Blodgett (LB) films from various fatty acid salts. Previous thermoanalytical measurements at compact samples revealed the appearance of two different phase transition temperatures; the lower one is related to the acid the second one to the acid salt molecules. In spite of ill defined electrical contacts with the film the characteristic DLS frequencies obtained from about 100nm thick multilayer films are similar to those recorded from bulk samples. No significant variations of frequencies were found changing the counter ions. Besides conductivity influence at low frequncies we found two relaxations related to the mobility of the dipolar carboxylat-metal group at about 100 and 10000Hz. One of these frequencies is related to the rotation around the chain axis. The strength of this relaxation increases significantly with increasing the sample temperature above 105°C. This temperature is connected with a structural phase transition observed by X-ray reflectometry. In case of Pb-stearate the results of the dielectric measurements help to interprete this structural change as a transition from an orthorhombic into a free-rotator phase. The uncorrelated rotation of molecules around their molecular axes initiates a much increased relaxation strength at the carboxylat-metal sites.
Y1  - 2000
ER  - 
TY  - JOUR
A1  - Mukhopadhyay, M. K.
A1  - Datta, A.
A1  - Sanyal, M. K.
A1  - Geue, Thomas
A1  - Pietsch, Ullrich
T1  - Synchrotron Studies of Melting of Langmuir-Blodgett Films
Y1  - 2001
ER  - 
TY  - JOUR
A1  - Avilov, Anatoly S.
A1  - Lepeshov, G. G.
A1  - Pietsch, Ullrich
A1  - Tsirelson, Vladimir G.
T1  - Multipole analysis of the electron density and electrostatic potential in Germanium by high-resolution electron diffraction
Y1  - 2001
SN  - 0022-3697
ER  - 
TY  - JOUR
A1  - Davaasambuu, Jav
A1  - Daniel, A.
A1  - Stahn, Jochen
A1  - Pietsch, Ullrich
T1  - Comparison of experimental and theoretical valence charge densites in cubic ZnSe
Y1  - 2001
SN  - 0022-3697
ER  - 
TY  - JOUR
A1  - Grenzer, Jörg
A1  - Darowski, Nora
A1  - Geue, Thomas
A1  - Pietsch, Ullrich
A1  - Daniel, A.
A1  - Rennon, Siegfried
A1  - Reithmaier, Johann-Peter
A1  - Forchel, Alfred
T1  - Strain analysis and quantum well intermixing of a laterally modulated multiquantum well system produced by focused ion beam implantation
Y1  - 2001
ER  - 
TY  - JOUR
A1  - Zeimer, Ute
A1  - Grenzer, Jörg
A1  - Pietsch, Ullrich
A1  - Bugge, F.
A1  - Smirnitzki, V.
A1  - Weyers, Markus
T1  - Investigation of strain-modulated InGaAs-nanostructures by grazing-incidence x-ray diffraction and photoluminescence
Y1  - 2001
ER  - 
TY  - JOUR
A1  - Zeimer, Ute
A1  - Bugge, F.
A1  - Gramlich, S.
A1  - Smirnitzki, V.
A1  - Weyers, Markus
A1  - Tränkle, G.
A1  - Grenzer, Jörg
A1  - Pietsch, Ullrich
A1  - Cassabois, G.
A1  - Emiliani, V.
A1  - Linau, Christoph
T1  - Evidence of strain-induced lateral carrier confinement in InGaAs-quantum wells by low-temperature near-field spectroscopy
Y1  - 2001
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Grenzer, Jörg
A1  - Geue, Thomas
A1  - Neißendorfer, Frank
A1  - Brezesinski, Gerald
A1  - Symietz, Christian
A1  - Möhwald, Helmuth
A1  - Gudat, Wolfgang
T1  - The energy dispersive reflectometer at BESSY II : a challenge for thin film analysis
Y1  - 2001
SN  - 0167- 5087
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Zeimer, Ute
A1  - Hofmann, L.
A1  - Grenzer, Jörg
A1  - Gramlich, S.
T1  - Strain induced compositional modulations in AlGaAs overlayers induced by lateral surface gratings
Y1  - 2001
SN  - 0272-9172
ER  - 
TY  - JOUR
A1  - Davaasambuu, Jav
A1  - Daniel, A.
A1  - Stahn, Jochen
A1  - Pietsch, Ullrich
T1  - Harmonic and anharmonic thermal vibrations in cubic ZnSe
Y1  - 2001
SN  - 0044-2968
ER  - 
TY  - JOUR
A1  - Tsirelson, Vladimir G.
A1  - Avilov, Anatoly S.
A1  - Lepeshov, G. G.
A1  - Kuligin, A. K.
A1  - Stahn, Jochen
A1  - Pietsch, Ullrich
A1  - Spence, J. C. H.
T1  - Quantitative Analysis of the Inner-Crystal Electrostatic Potential of several Rock-Salt-Structure Crystals Using Accurate Electron-Diffraction Data
Y1  - 2001
SN  - 1089-5647
ER  - 
TY  - JOUR
A1  - Stahn, Jochen
A1  - Pietsch, Ullrich
A1  - Blaha, Pawel
A1  - Schwarz, K. H.
T1  - Electric field induced charge-density variations in covalently bonded compounds
Y1  - 2001
ER  - 
TY  - JOUR
A1  - Poloucek, P.
A1  - Pietsch, Ullrich
A1  - Geue, Thomas
A1  - Symietz, Christian
A1  - Brezesinski, Gerald
T1  - X-ray reflectivity analysis of thin complex Langmuir-Blodgett films
Y1  - 2001
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Stahn, Jochen
A1  - Davaasambuu, Jav
A1  - Pucher, Andreas
T1  - Electric field induced charge density variations in partially-ionic compounds
Y1  - 2001
SN  - 0022-3697
ER  - 
TY  - JOUR
A1  - Henneberg, Oliver
A1  - Chi, Li Feng
A1  - Geue, Thomas
A1  - Saphiannikova, Marina
A1  - Pietsch, Ullrich
A1  - Rochon, Paul
A1  - Natansohn, Almeria
T1  - Atomic force microscopy inspection of the early state of formation of polymer surface relief grating
Y1  - 2001
ER  - 
TY  - JOUR
A1  - Henneberg, Oliver
A1  - Geue, Thomas
A1  - Saphiannikova, Marina
A1  - Pietsch, Ullrich
A1  - Rochon, Paul
A1  - Natansohn, Almeria
T1  - Formation and dynamics of polymer surface relief gratings
Y1  - 2001
SN  - 0378-5963
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
T1  - Reversible negative thermal expansion of polymer films
Y1  - 2002
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
T1  - X-ray reflectivity from sinusoidal surface relief gratings
Y1  - 2002
ER  - 
TY  - JOUR
A1  - Bodenthin, Yves
A1  - Grenzer, Jörg
A1  - Lauter, Robert
A1  - Pietsch, Ullrich
A1  - Lehmann, Pit
A1  - Kurth, Dirk G.
A1  - Möhwald, Helmuth
T1  - Temperature and time resolved x-ray scattering at thin organic films
Y1  - 2002
ER  - 
TY  - JOUR
A1  - Geue, Thomas
A1  - Henneberg, Oliver
A1  - Pietsch, Ullrich
T1  - X-ray reflectivity from sinusoidal surface relief gratings
Y1  - 2002
SN  - 0023-4753
ER  - 
TY  - JOUR
A1  - Geue, Thomas
A1  - Saphiannikova, Marina
A1  - Henneberg, Oliver
A1  - Pietsch, Ullrich
A1  - Rochon, Paul
A1  - Natansohn, Almeria
T1  - Formation mechanism and dynamics in polymer surface gratings
Y1  - 2002
ER  - 
TY  - JOUR
A1  - Geue, Thomas
A1  - Henneberg, Oliver
A1  - Grenzer, Jörg
A1  - Pietsch, Ullrich
A1  - Natansohn, Almeria
A1  - Rochon, Paul
A1  - Finkelstein, Kenneth D.
T1  - Formation of a buried density grating on thermal erasure of azobenzene polymer surface gratings
Y1  - 2002
SN  - 0927-7757
ER  - 
TY  - JOUR
A1  - Pietsch, Ullrich
A1  - Kubowicz, Stephan
A1  - Thünemann, Andreas F.
A1  - Geue, Thomas
A1  - Watson, M. D.
A1  - Tchebotareva, N.
A1  - Müllen, K.
T1  - X-ray reflectivity study of an amphiphilic hex-peri-hexabenzocoronene at a structured silicon wafer surface
Y1  - 2003
ER  -